JFET (junction field-effect transistor) device and manufacturing method thereof
A device and condition technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of low cost, can not well meet the application of constant current source circuit, etc., achieve small constant current accuracy, constant current good effect
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[0038] In this example, a shallow trench auxiliary layer is formed by digging a trench and filling a dielectric material layer, specifically:
[0039] Step 1: Select an NTD monocrystalline silicon wafer with a thickness of about 400-700 μm and a resistivity of 0.001-0.005Ω·cm;
[0040] Step 2: growing a P-type epitaxial layer 5 on the surface of the silicon wafer, the growth condition is a temperature of 1100°C-1150°C, the thickness of the P-type epitaxial layer 5 is 5-25 μm, and the resistivity is 8-12Ω·cm;
[0041] Step 3: Thermally grow oxide layer with a thickness of
[0042] Step 4: Form a first P-type isolation region 7 and a second P-type isolation region 8 on both sides of the P-type epitaxial layer 5 by photolithography and ion implantation, specifically: grow 40-100nm thick before ion implantation The oxide layer, ion implantation after photolithography, ion implantation conditions: dose 1e15 ~ 8e15cm -2 , Energy 40~80KeV, redistribution condition: anaerobic cond...
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