On-line quality inspection method of diamond wire particles based on machine vision
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- WUHU HIT ROBOT TECH RES INST
- Publication Date
- 2016-08-17
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Abstract
Description
technical field
[0001] The invention relates to the field of detection of cutting wires, in particular to an online quality inspection method of diamond wire particles based on machine vision. Background technique
[0002] Crystalline silicon is an important raw material for solar photovoltaic industry and semiconductor industry. Since crystalline silicon is a typical hard and brittle material, diamond wire cutting machine is currently used to cut crystalline silicon. Using it to cut crystalline silicon has the advantages of fast speed, low cost and environmental protection. Advantages, while the main working part of the diamond wire cutting machine is a cutting wire with diamond particles consolidated on its surface by electroplating, which is the diamond wire. When cutting crystalline silicon, the quality of the diamond wire directly affects the quality and production efficiency of the cut silicon wafers. The quality of the diamond wire needs to be strictly monitored durin...