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Device and method to prevent inter-system interference

A technique for waveforms, measuring instruments, used in the separation and processing of long recorded waveforms to resolve problems such as errors

Active Publication Date: 2014-10-15
TEKTRONIX INC
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] Furthermore, when using de-embedding or analog filters generated by applications such as Serial Data Link Analysis (SDLA), combining two different system characteristics into a filter convolution will lead to erroneous results

Method used

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  • Device and method to prevent inter-system interference

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Embodiment Construction

[0018] In the various figures, which are not necessarily to scale, like or corresponding elements of the disclosed systems and methods are indicated by like reference numerals.

[0019] figure 1 Two transmitters in the DUT are shown. The first transmitter 102 drives the line for a period of time, and then the switch or multiplexer 104 changes so that the second transmitter 106 drives the line for a period of time. The first transmitter 102 and the second transmitter 106 have different characteristic S-parameters that define their behaviour. For example, if the first and second transmitters 102 and 106 are used in a DDR memory, the first transmitter 102 will drive the line with ODT turned off. After the switch 104 is changed, the second transmitter 106 will drive the link with the ODT turned on.

[0020] Due to changes in the DUT hardware configuration during acquisition, from having figure 1 The waveforms acquired by the DUT for the two transmitters shown in have time-vary...

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Abstract

The invention discloses a device and method to prevent inter-system interference. Provided is a method of preventing inter-system interference while acquiring waveforms in a test and measurement instrument with variation in a device under test system S-parameters. The method includes receiving a waveform from a device under test at the test and measurement instrument, digitizing the waveform, identifying portions of the digitized waveform with different S-parameter characteristics, separating the identified portions of the digitized waveform into different waveforms, and displaying the different waveforms to a user.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of the filing date of U.S. Provisional Patent Application No. 61 / 808,746, filed April 5, 2013 and entitled "Method to Prevent Inter-System Interference," the disclosure of which is hereby incorporated by reference in its entirety and into this article. technical field [0003] The present disclosure relates to methods and apparatus for separating and processing long recorded waveforms containing segments with varying S-parameters of the device under test system. Background technique [0004] There are many applications currently running on test and measurement instruments such as oscilloscopes that process data from various serial data links, memory buses such as double data rate (DDR) buses, or multimode buses such as mobile Industry Processor Interface (MIPI)) long data records. Some of these devices under test (DUTs) have transmission modes where the source or load impedance can...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R13/02
CPCG01R13/0236G01R13/02G01R27/30G01N31/02G01N27/42F02P17/00G01R31/24G01R31/44G01R31/2635
Inventor J.J.皮克德
Owner TEKTRONIX INC
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