Removal method of residual oil and water vapor in the vacuum spectroscopic chamber of x-fluorescence spectrometer

Abstract

The invention relates to a removal method for residual oily soil and water vapor in a vacuum spectrometer chamber of an X-ray fluorescence spectrophotometer. The method is carried out after cleaning and wiping visual oily soil and water vapor on the internal surface of the spectrometer chamber of the X-ray fluorescence spectrophotometer, and is characterized by comprising the following steps of: heating and baking the spectrometer chamber to volatilize the residual oily soil and water, putting a molecular sieve in a molecular sieve storage case, allowing the molecular sieve storage case to enter the spectrometer chamber and absorb the volatilized oily soil and the water, purging the oily soil and the water vapor in the spectrometer chamber of the X-ray fluorescence spectrophotometer with a negative pressure pulse gas flow, allowing spectrophotometers to perform vacuum leakage alternately in turn, using the negative pressure pulse purging gas flow for removal, and exhausting oil gas and the water vapor blown away by the negative pressure pulse purging gas flow to thoroughly remove pollutants in the spectrometer chamber. The method removes the oily soil and the water vapor in the spectrometer chamber of the spectrophotometer efficiently and thoroughly, allows analytical test data to be stable, and enables the instruments to run reliably; an operating method is easy to grasp, and a spectrometer system is not damaged during use.

Description

technical field [0001] The invention relates to a physical and chemical detection device, in particular to a cleaning method for an X fluorescence spectrometer. Background technique [0002] The X-ray fluorescence spectrometer is responsible for the grade test of incoming raw materials such as iron ore and various auxiliary materials, the composition analysis of sintered ore and other furnace materials required for smelting, the composition analysis of various chemical elements in blast furnace molten iron, and the test of the coating thickness of various finished plates. As well as undertaking the test and analysis tasks of samples in a large number of scientific research projects, X-ray fluorescence spectrometers are important physical and chemical testing instruments and equipment for modern metallurgical enterprises. [0003] The structure of the X-ray fluorescence spectrometer's spectroscopic system is complicated, the internal shape is irregular, and there are many par...

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Problems solved by technology

This patent application relates to mechanical hardware pipe cleaning devices, and does not involve the removal of residual oil, sewage and vapor in the spectroscopic chamber of the X-ray fluorescence spectrometer

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