Supercharge Your Innovation With Domain-Expert AI Agents!

Junction barrier Schottky diode

A technology of Schottky diodes and silicon substrates, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., and can solve the problems of increased device size and cost

Inactive Publication Date: 2017-04-12
RICHTEK TECH
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the addition of electrostatic discharge components will increase the size and cost of the device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Junction barrier Schottky diode
  • Junction barrier Schottky diode
  • Junction barrier Schottky diode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] figure 2 It is a cross-sectional structure diagram of the disclosed first embodiment of the junction barrier Schottky diode 200 of the present invention. The junction barrier Schottky diode 200 of the present invention is a component realized by semiconductor manufacturing process. The junction barrier Schottky diode 200 includes a silicon substrate 210 , a first P-type doped region 240 , a metal layer 250 , a second P-type doped region 262 , and a first N-type doped region 260 .

[0049] The silicon substrate 210 has an upper surface 211 . The silicon substrate 210 has an N-type buried layer 212 below the upper surface 211 . An N-type well 213 is formed between the upper surface 211 of the silicon substrate 210 and the N-type buried layer 212 . The N-type buried layer 212 is used to reduce the leakage current between the upper components, so that the components can be arranged more closely and the overall area can be reduced.

[0050]The first P-type doped region ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A junction barrier Schottky diode comprises a silicon substrate which is provided with an upper surface which is provided with an N buried layer below, an N well being arranged between the upper surface and the N buried layer; a first P-type doping region which is arranged in the N well and extends downwards from the upper surface; a metal layer which is covered on the upper surface and is arranged above one side of the first P-type doping region; a second P-type doping region which arranged in the N well, extends downwards from the upper surface, and is arranged at the other side of the first P-type doping region; and a first N-type doping region which arranged in the N well, extends downwards from the upper surface, and is arranged at the other side of the first P-type doping region.

Description

[0001] 【Technical field】 [0002] The present invention relates to a Junction Barrier Schottky Diode (JBS Diode), in particular to a Junction Barrier Schottky Diode with better electrostatic discharge (Electrostatic Discharge) effect. [0003] 【Background technique】 [0004] figure 1 It is a cross-sectional structure diagram of a common junction barrier Schottky diode 100 . The junction barrier Schottky diode 100 includes a silicon substrate 110 , a field oxide layer (field oxide) 120 , a field oxide layer 130 , a plurality of P-type doped regions 140 , a metal layer 150 , and an N-type doped region 160 . [0005] The silicon substrate 110 has an upper surface 111 . The silicon substrate 110 has an N-type buried layer 112 (N buried layer, NBL) below the upper surface 111 . An N-type well 113 (Nwell) is formed between the upper surface 111 of the silicon substrate 110 and the N-type buried layer 112 . The field oxide layer 120 and the field oxide layer 130 are respectively d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/872H01L29/06
CPCH01L29/0684H01L29/872
Inventor 洪崇佑杨清尧高字成黄宗义翁武得
Owner RICHTEK TECH
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More