Failure mechanism obtaining method under long-life optical film space environmental effect
A space environment and optical thin film technology, applied in the direction of scattering characteristic measurement, transmittance measurement, etc., can solve the problems of long-life optical thin film performance degradation, failure, etc.
Inactive Publication Date: 2014-12-24
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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[0004] In view of the above analysis, the present invention aims at the performance degradation and failure of long-life optical films under the action of space environment, and proposes a method for obtaining the failure mechanism of long-life optical films under the action of space environment
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[0022] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0023] The method for obtaining the failure mechanism of the long-life optical thin film under the action of the space environment of the present invention, such as figure 1 As shown, the specific steps are:
[0024] Step 1. Use the space environment ground simulation equipment to conduct a single space environment simulation test and a space comprehensive environment simulation test on the long-life optical film, and test the optical properties of the long-life optical film before and after the space environment, and obtain its performance change law under the space environment .
[0025] Step 2. Using surface analysis technology to analyze the microstructure of the long-life optical film before and after the space environment, and obtain the change rule of its microstructure;
[0026] Step 3. Establish the corresponding relationship betwe...
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The invention provides a failure mechanism obtaining method under long-life optical film space environmental effect. The method comprises the following specific processes: performing single-space environmental simulation test and space comprehensive environmental simulation test on a long-life optical film by using a space environmental ground simulation device, and simultaneously testing the optical properties of the long-life optical film before and after space environmental effect to acquire the optical property change rule under the space environmental effect; analyzing the microstructures of the long-life optical film before and after space environmental effect by using a surface analysis technology to obtain the microstructure change rule; establishing the corresponding relation of the optical property change and the microstructure change of the long-life optical film before and after space environmental effect to obtain the influence on the optical property caused by the microstructure change so as to acquire the failure mechanism of the long-life optical film under the space environmental effect by using the influence as the basis. The technology basis is provided for the design and production of the space optical film. The failure mechanism acquired by the invention can provide the theoretical foundation for the design and the production of the long-life optical film.
Description
technical field [0001] The invention relates to a method for acquiring a failure mechanism of a long-life optical thin film under the action of a space environment, and belongs to the technical field of material failure analysis. Background technique [0002] The long-life and high-reliability support technology for spacecraft is a highly comprehensive system engineering. Materials are one of the most basic units of a spacecraft, and its performance level will directly affect the reliability and life of the spacecraft on orbit. Optical thin film technology is an old and new optical technology. Optical thin film is an important branch of modern optics, and it is also an important part of modern optical instruments and various optical devices. Space optical thin film technology has developed into a unique optical thin film application technology, which provides a technical basis for space exploration and remote sensing. Optical thin films are mainly used for spectral selectio...
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IPC IPC(8): G01N21/59G01N21/55
Inventor 张剑锋郭云杨生胜王鹢秦晓刚高欣
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH