Device and method for measuring warping degree of substrate, touch screen and manufacturing method of touch screen
A measuring device and warpage technology, which is applied in the direction of measuring devices, optical devices, and data processing input/output processes, can solve problems such as easy generation of bubbles, easy fall-off, and impact on the yield of external touch screens, and achieve improvement. Yield rate and productivity improvement effect
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[0048] The specific implementations of the measuring device and measuring method of the warpage degree of the substrate, the touch screen and the manufacturing method provided by the embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
[0049] An embodiment of the present invention provides a device for measuring the warpage of a substrate, such as figure 1 shown, including: at least one laser 1 ( figure 1 Only one laser is shown) and a charge-coupled device 2 (Charge Coupled Device, CCD) which is in one-to-one correspondence with the laser 1 and is fixedly connected;
[0050] Laser 1, for emitting laser light to the surface to be measured of substrate 3 at a preset incident angle;
[0051] The charge-coupled element 2 is used to receive the laser light emitted by the corresponding laser 1 and reflected on the surface to be measured on the substrate 3 .
[0052] Based on the same inventive concept, an embodiment...
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