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Infrared glass refractive index photoelectric detection system based on measured top angle and incident angle

A technology of infrared glass and photoelectric detection, which is applied in the field of optics, can solve the problems of complex calculation and operation, and the high price of double-layer high-precision one-dimensional turntables, so as to reduce input costs, improve measurement and test efficiency, and ensure test accuracy.

Active Publication Date: 2015-03-04
CHANGCHUN UNIV OF SCI & TECH
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Problems solved by technology

However, the price of the double-layer high-precision one-dimensional turntable is high, and it is relatively complicated in terms of calculation and operation.

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  • Infrared glass refractive index photoelectric detection system based on measured top angle and incident angle

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Embodiment Construction

[0018] As shown in the figure, the infrared glass refractive index photoelectric detection system based on the measurement of the vertex angle and the incident angle includes the measured prism 6, and is characterized in that: the light source xenon lamp 1, the monochromator 2, the beam splitter 3, the separation prism, etc. Axial parabolic reflector 4, chopper 5, single-layer high-precision one-dimensional turntable 7, detector I8, detector II9, detector III10 and detector IV11; the top of the single-layer high-precision one-dimensional turntable 7 is placed Measuring prism 6, single-layer high-precision one-dimensional turntable 7 is a single-layer one-dimensional turntable, which provides readings for measuring prism apex angle and prism minimum deflection angle, and single-layer high-precision one-dimensional turntable 7 is combined with detector II9 and detector III10 for measurement The vertex angle of the prism is measured by the combination of the single-layer high-prec...

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Abstract

The invention relates to an infrared glass refractive index photoelectric detection system based on measured top angle and incident angle, and belongs to the technical field of optics. The system is characterized in that a detected prism is arranged at the top of a single-layer high-precision one-dimensional rotary table; the single-layer high-precision one-dimensional rotary table is a single-layer one-dimensional rotary table, provides read values for measured top angle and minimum deviation angle of the prism, is combined with a detector II and a detector III for measuring the top angle of the prism, and is combined with a detector I for measuring the minimum deviation angle of the prism; the detector II and the detector III are arranged in a manner of forming an angle of 120 degrees; a detector IV is over against a beam splitter prism; a light source xenon lamp, a monochrometer and an off-axis parabolic mirror form parallel light simulating an infinite target. Compared with the prior art, the system has the characteristics that a conventional dual-layer high-precision one-dimensional rotary table is replaced with the single-layer high-precision one-dimensional rotary table, a device is simple, economy and feasibility are achieved, the precision is high, and the cost is low.

Description

technical field [0001] The invention belongs to the field of optical technology, in particular to a refractive index photoelectric detection system. Background technique [0002] Among the performance parameters of many infrared optical materials, the refractive index parameter is an important parameter that designers of infrared optical systems must accurately understand. Only by knowing this parameter data can optical designers complete high-quality design work. In the domestic measurement system of infrared glass refractive index, the method of angle measurement is adopted. Among them, the minimum deflection angle method has higher accuracy in measuring the refractive index of glass, and it is also the method chosen by most researchers. The system uses a double-layer high-precision one-dimensional turntable to measure the vertex angle and minimum deflection angle of the triangular prism, so as to obtain refractive index. However, the price of the double-layer high-preci...

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Application Information

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IPC IPC(8): G01N21/41
Inventor 王劲松王莹安志勇崔士宝李延风
Owner CHANGCHUN UNIV OF SCI & TECH
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