Multi-step ADC with sub-ADC calibration
A sub-analog-to-digital converter technology, used in analog/digital conversion calibration/testing, analog-to-digital converters, etc., can solve problems such as extra complexity, inability to solve static comparator offsets, and increasing the output voltage range of residual amplifiers
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[0022] In the following description, for purposes of explanation, specific details are set forth in order to facilitate the understanding of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced without these details. Those skilled in the art will appreciate that the embodiments of the invention described below can be practiced in various ways and using various devices. Those skilled in the art will also recognize that additional modifications, applications, and embodiments are within the scope of the invention, as the invention may find utility in other fields. Accordingly, the following examples are illustrative of specific embodiments of the invention and are intended not to obscure the invention.
[0023] References in the specification to "one embodiment" or "an embodiment" mean that a specific feature, structure, characteristic or function described in connection with the embodiment is included in at least one...
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