Transmittance measurement device and transmittance measurement method
A technology of testing device and testing method, which is applied in the field of measurement, can solve the problems of lowered and inaccurate transmittance testing accuracy, and achieve the effects of consistent testing environment, accurate testing results, and simple structure
Inactive Publication Date: 2015-03-25
BIAOQI ELECTRONICS TECH
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Problems solved by technology
[0005] In such a test optical path, it is difficult to avoid the secondary reflection of the sample, and the incident light overflows from the sample, resulting in errors in the test transmittance results, resulting in reduced and inaccurate transmittance test accuracy
Method used
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Embodiment Construction
[0030] Embodiments of the present invention are described in detail below:
[0031] The transmittance testing device includes an integrating sphere 1, a light emitter 2, and a detector 3. The integrating sphere 1 has a first light inlet 11, a second light inlet 12, and a detection port 13. The light emitter 2 is used to emit test light and detect The device 3 tests the illumination data of the light transmitted through the detection port 13, wherein the illumination data is the spectral energy distribution data of the illumination.
[0032] The first light inlet 11 and the second light inlet 12 have the same specification and are round holes with the same diameter.
[0033] The shape of the integrating sphere 1 is a hexahedron (in this embodiment, the shape of the integrating sphere is selected as a hexahedron, but the shape of the integrating sphere is not limited to a hexahedron), and the first light inlet 11 and the second light inlet 12 are located at any two of the hexahe...
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Abstract
The invention relates to a transmittance measurement device and a transmittance measurement method. Measurement illumination data and reference illumination data are obtained: a sample is put on a light channel of any light inlet, measurement light emitted by a light emitter penetrates through the sample and emits into an integrating sphere from the light inlet, and a detector measures the measurement illumination data at a detection opening; the sample is put on a light channel of any light inlet, the measurement light emitted by the light emitter emits into the integrating sphere from another light inlet, and the detector measures the reference illumination data at the detection opening; the measured measurement illumination data and the reference illumination data are compared so as to obtain the transmittance of the sample. The errors of measured transmittance, caused by secondary reflection of the sample and overflowing of the measurement light from the sample,are eliminated, and the measurement precision of the sample transmittance is improved.
Description
technical field [0001] The invention belongs to the field of measurement, and in particular relates to a transmittance testing device and a transmittance testing method. Background technique [0002] In the process of the incident light flux from the illuminated surface or medium incident surface to the other side, the ratio of the radiant energy projected and transmitted through the object to the total radiant energy projected on the object is called the transmittance of the object. [0003] The existing transmittance detection technology generally adopts the method of measuring the luminous flux or light energy after the incident light passes through the object, and comparing the test value with the luminous flux or total energy of the incident light to obtain the transmittance of the object. [0004] First, without passing through the sample, directly measure the luminous flux or light energy of the incident light to obtain the reference illumination data. Secondly, test...
Claims
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IPC IPC(8): G01N21/59
Inventor 宋光均吴剑峰郑祥利
Owner BIAOQI ELECTRONICS TECH