Nano-particle size measurement device and method

A nanoparticle and measuring device technology, which is applied in the direction of measuring devices, particle size analysis, particle and sedimentation analysis, etc., can solve the problems of long time consumption, achieve the effect of short time consumption, simple data processing process, and reduced measurement time

Active Publication Date: 2015-04-29
UNIV OF SHANGHAI FOR SCI & TECH
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  • Nano-particle size measurement device and method

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Embodiment 1

[0039] Depend on figure 2 As shown, the nanoparticle particle size measurement device is characterized in that it is composed of a laser source 1, a first lens 2, a sample pool 3, a second lens 4, an area array photosensitive device camera 5 and a computer 6, and the laser beam emitted by the laser source 1 The nanoparticles in the sample pool 3 are converged by the first lens 2, and the particles in the sample pool 3 undergoing Brownian motion under the incident laser irradiation generate dynamic light scattering signals, and the dynamic light scattering signals of these particles pass through the second lens 4 Convergence, the area array photosensitive device camera 5 arranged on the focal plane of the lens records at a time interval of Δτ, and obtains two images of dynamic light scattering signals of the movement of nanoparticles, which are sent to the computer 6, and the computer 6 calculates the two images by using a correlation algorithm The correlation coefficient of ...

Embodiment 2

[0041] When the nanoparticles are very small, such as below 10 nm, according to figure 1 The time interval between the two images is required to be very short, maybe only a few microseconds, or even less than 1 microsecond, and the time interval between the two images taken by the camera is difficult to achieve such a small time interval. This can be done by using 2 cameras to capture 2 identical images respectively, by image 3 As shown, the nanoparticle particle size measuring device is characterized in that a semi-transparent half-reflective prism 7 can also be placed behind the second lens 4, for the first exit surface B of the half-transparent half-reflective prism 7 and the second The first surface array photosensitive device 5 and the second surface array photosensitive device camera 8 are installed on the two exit faces C respectively. The laser beam emitted by the laser source 1 is first converged by the lens 2 and then enters the sample cell 3. The dynamic scatte...

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Abstract

The invention discloses a nano-particle size measurement device and method. The device consists of a laser source, a sample cell, lenses, an area array photosensitive device and a computer, wherein laser beams emitted by the laser source irradiate nanoparticles in the sample cell after being converged, dynamic light scattering signals are generated by the particles performing Brownian movement in the sample cell under the irradiation of incident laser, and are converged after passing through the second lens, the area array photosensitive device arranged on the focal plane of the lens performs recording at a time interval of Deltatau to obtain two dynamic light scattering signal images of movement of the nanoparticles, and transmits the images to the computer, and the computer calculates a correlation coefficient of the two images by adopting a correlation algorithm, and determines the particle size of the nanoparticles according to the correlation coefficient. The device and the method have the benefits that measurement time is greatly shortened, and can reach the microsecond level, a data processing process is simple and low in time consumption, and the total measurement time can be millisecond or microsecond time.

Description

technical field [0001] The present invention relates to a particle size measuring device and method based on the principle of dynamic light scattering, in particular to a method and device for measuring the particle size and distribution of nanoparticles by analyzing the correlation relationship between two images of dynamic light scattering signals of nanoparticles using a correlation algorithm . Background technique [0002] At present, the particle measurement methods based on the principle of light scattering can be divided into two categories: static light scattering and dynamic light scattering. [0003] The most important static light scattering measurement method is the laser particle size analyzer. Its basic principle is that when the laser is incident on the particle to be measured, the particle will scatter the incident laser light, and the spatial distribution of the scattered light energy is related to the size of the particle. The spatial distribution of the e...

Claims

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Application Information

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IPC IPC(8): G01N15/02
Inventor 蔡小舒周骛刘丽丽
Owner UNIV OF SHANGHAI FOR SCI & TECH
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