Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Automatic optical detection method and automatic optical detection system

An automatic optical inspection, external light technology, applied in optics, optical testing flaws/defects, nonlinear optics, etc., to reduce unqualified products, improve yield, and improve quality

Active Publication Date: 2015-07-01
EVOC SMART IOT TECH CO LTD
View PDF5 Cites 67 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Based on this, it is necessary to provide an automatic optical detection method for the problem of low quality of liquid crystal display screens that can only detect dead pixels and bright line defects, which can detect various defects, thereby improving the quality of liquid crystal display screens

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic optical detection method and automatic optical detection system
  • Automatic optical detection method and automatic optical detection system
  • Automatic optical detection method and automatic optical detection system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0029] figure 1 A schematic diagram of an implementation environment involved in the automated optical inspection method. The implementation environment includes a camera 110 , a light source 120 , an image acquisition card 130 , a computer 140 , a display 150 , a detected liquid crystal display 160 and a drive system 170 . Wherein, the computer 140 is connected with the image acquisition card 130 , the display 150 and the liquid crystal display screen 160 to be detected respectively, the camera 110 is connected with the image acquisition card 130 , and the drive system 170 is connected with the c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an automatic optical detection method and an automatic optical detection system. The method comprises the following steps: obtaining liquid crystal screen images in preset display states of multiple pure colours, grey-scale images, grey-level images and multi-colour alternating images respectively; processing the liquid crystal screen images in the obtained display states, judging whether a liquid crystal screen has defects or not, if so, then identifying the types of the defects, recording the positions of the defects, and counting the number of the defects; obtaining the liquid crystal screen images of the turned-off liquid crystal screen in an external light irradiation state; processing the liquid crystal screen images in the obtained external light irradiation state, and judging whether the liquid crystal screen has appearance defects or not. According to the automatic optical detection method and the automatic optical detection system provided by the invention, brightness, dark spots, bright lines, dark lines, surface defects and appearance defects can be detected, defect detection types are increased, unqualified products are reduced, the quality of the liquid crystal screen is improved, a production line can be improved, and the production yield of the liquid crystal screen can be increased.

Description

technical field [0001] The invention relates to the field of automatic optical detection, in particular to an automatic optical detection method and system. Background technique [0002] In recent years, due to the light and thin characteristics of LCD (Liquid Crystal Display), it has been used in most communication products (such as car navigation systems, mobile phones), consumer electronics products (such as LCD TVs, cameras) ), instrument products and industrial automation products and other fields, all use LCD as the control panel, and its application range is very wide. Since the entire LCD production process is long, and the size of the substrate is getting larger and the size of the circuit is getting more and more precise, therefore, strict quality control is required in the production process of the LCD. The traditional LCD inspection method is mainly through manual inspection. Due to the subjective differences of people, it will bring many uncontrollable factors ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G02F1/13
Inventor 陈志列庞观士林淼刘恩锋邹建红方小明
Owner EVOC SMART IOT TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com