Test method for light attenuation of photovoltaic module

A technology of photovoltaic modules and testing methods, applied in the monitoring of photovoltaic systems, photovoltaic power generation, photovoltaic modules, etc., can solve problems such as early failure of photovoltaic modules, differences in electrical performance of photovoltaic modules, abnormal output curves of photovoltaic modules, etc.

Active Publication Date: 2015-07-29
SUZHOU EPOWER CORP LTD
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  • Summary
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the light attenuation rate of mainstream polysilicon solar cells can be controlled within 1%. After light-induced attenuation, the electrical performance of photovoltaic modules may vary greatly, which will cause abnormal output curves and hot spots of photovoltaic modules, and may even cause The early failure of photovoltaic modules, so the light attenuation of photovoltaic modules has become one of the important items to evaluate the quality of photovoltaic modules

Method used

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Embodiment Construction

[0023] Preferred embodiments of the present invention will be described in detail below.

[0024] In order to achieve the purpose of the present invention, in one of the embodiments of the present invention, a method for testing the light attenuation of photovoltaic modules is provided, including the following steps:

[0025] Step 1. Select photovoltaic modules and conduct initial tests. The initial tests include the appearance of photovoltaic modules, power output tests and EL tests. Power output tests measure the short-circuit current I of photovoltaic modules under standard test conditions. SC ;

[0026] Step 2: Turn on the environmental chamber and preheat the full-spectrum xenon lamp to stabilize the irradiance. The preheating time is 30-60 minutes.

[0027] Step 3: Put the photovoltaic module in step 1 into the environmental chamber, and measure the instantaneous short-circuit current I of the photovoltaic module in the chamber 瞬时sc , at the same time, the instant irra...

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Abstract

The invention discloses a test method for light attenuation of a photovoltaic module, comprising the following steps of: S1, selecting the photovoltaic module and performing initial test, and measuring the short circuit current Isc of the photovoltaic module under standard test condition; S2, opening an environment box, and preheating an xenon lamp with full spectrum to allow the irradiation to be stable; S3, putting the photovoltaic module in the S1 into the environment box, measuring the instantaneous short circuit current I instantaneous sc when the photovoltaic module enters the box, and meanwhile working out the immediate irradiation of the photovoltaic module according to a formula, and obtaining the period to be tested according to the immediate irradiation; S4, after the test in the S3 is completed, taking out the photovoltaic module and performing the power output test and EL test. According to the test method provided by the invention, the influence of optical radiation to the attenuation of the photovoltaic module is assessed through measuring the power attenuation of the photovoltaic module after optical radiation by the photovoltaic module, and thereby the performance of the photovoltaic module is assessed.

Description

technical field [0001] The invention belongs to the field of photovoltaic module testing, and in particular relates to a method for testing light attenuation of a photovoltaic module. Background technique [0002] Light-induced degradation (LID) refers to the phenomenon that the output power of solar cells or photovoltaic modules tends to stabilize after a large drop in the initial stage of use. [0003] It is confirmed by various experiments that boron and interstitial oxygen in crystalline silicon are the main factors causing light attenuation of boron-doped Cz-Si solar cells. In the current traditional Cz single crystal silicon, oxygen is the main impurity in crystalline silicon, and atomic oxygen is in the interstitial position in the silicon body. After the boron-doped Cz-Si solar cell undergoes light or current injection, the boron and oxygen in the silicon body form a boron-oxygen complex, thereby reducing the minority carrier lifetime, resulting in a decrease in bat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02S50/10
CPCH02S50/00Y02E10/50
Inventor 张飞飞陈沁梅晓俊
Owner SUZHOU EPOWER CORP LTD
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