Test method for light attenuation of photovoltaic module
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SUZHOU EPOWER CORP LTD
- Publication Date
- 2015-07-29
Abstract
Description
technical field
[0001] The invention belongs to the field of photovoltaic module testing, and in particular relates to a method for testing light attenuation of a photovoltaic module. Background technique
[0002] Light-induced degradation (LID) refers to the phenomenon that the output power of solar cells or photovoltaic modules tends to stabilize after a large drop in the initial stage of use.
[0003] It is confirmed by various experiments that boron and interstitial oxygen in crystalline silicon are the main factors causing light attenuation of boron-doped Cz-Si solar cells. In the current traditional Cz single crystal silicon, oxygen is the main impurity in crystalline silicon, and atomic oxygen is in the interstitial position in the silicon body. After the boron-doped Cz-Si solar cell undergoes light or current injection, the boron and oxygen in the silicon body form a boron-oxygen complex, thereby reducing the minority carrier lifetime, resulting in a decrease in bat...