Improved method for prolonging product service life based on material ratio and key process parameter

A technology of process parameters and product life, applied in electrical digital data processing, special data processing applications, instruments, etc., to achieve the effect of guiding industrial production, saving sample volume and running time, and increasing life expectancy accurately

Active Publication Date: 2015-08-12
NAT UNIV OF DEFENSE TECH
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Problems solved by technology

However, the current analysis is mostly qualitative analysis for specific products, and there is a lack of a systematic

Method used

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  • Improved method for prolonging product service life based on material ratio and key process parameter
  • Improved method for prolonging product service life based on material ratio and key process parameter
  • Improved method for prolonging product service life based on material ratio and key process parameter

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Embodiment Construction

[0039] The present invention will be further described below in conjunction with specific embodiments.

[0040] Step 1, determining key process parameters and key performance parameters;

[0041] (1) Orthogonal test for trial production

[0042] A case product contains a total of 19 process parameters. In order to reduce the test samples, the level number of each parameter is taken as 2. Through analysis, select the orthogonal test table as L 20 (2 19 ), a total of 20 samples need to be produced. Its factors and factor levels are shown in Table 1:

[0043] Table 1 Factors and factor levels

[0044]

[0045] (2) Short-term degradation test of trial production products

[0046] After obtaining the trial-produced product, it is necessary to conduct a short-term performance degradation test under the same experimental conditions to observe and record the degradation of each performance parameter. Considering that the dimensions of each performance parameter are different...

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Abstract

An improved method for prolonging the product service life based on the material ratio and a key process parameter. The method comprises the following steps: 1, determining the key process parameter and a key performance parameter; 2, obtaining service life data of a product with the material ratio and the key process parameter controlled; 3, establishing a product service life prediction model based on the material ratio and the key process parameter; 4, optimizing the material ratio and the key process parameter to achieve prolonging of the product service life. According to the improved method for prolonging the product service life based on the material ratio and the key process parameter, the reliability and service life of the product are quantitatively adjusted in the view of optimizing the material ratio and the key process parameter, and the non-linear mapping relation model between the material ratio, the key process parameter and the product service life is established for the first time, so that the service life prolonging obtained according to the model is more accurate and more favorable for instructing the industrial production. The complete flow from parameter selection, data obtaining through experiment design and modeling to final prolonging of the service life is given. The method comprises the detailed steps and is easy to implement.

Description

technical field [0001] The invention belongs to the field of process improvement and reliability increase, and specifically relates to a systematic and quantitative process method for obtaining a product life-increasing scheme based on an existing process through test design and modeling analysis. Background technique [0002] Product reliability and lifetime growth have always been important issues in the field of reliability research. For many aerospace and optoelectronic core components, their life expectancy is high, technical difficulty is high, production cost is high, and production batches are small, so it is very difficult to achieve reliability and life growth. [0003] The traditional lifespan increase is achieved by exposing defects or failures through growth tests and improving weak links by zeroing faults. This growth method often requires a longer growth time, and the contradiction is particularly prominent for long-life core components. In addition, the desi...

Claims

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Application Information

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IPC IPC(8): G06F17/50
Inventor 孙权冯静潘正强陈娟程龙刘天宇黄彭奇子
Owner NAT UNIV OF DEFENSE TECH
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