An on-chip antenna testing device

Abstract

The invention proposes an on-chip antenna testing device. The adjustment mechanism is placed on the base of the probe station. The adjustment structure is composed of three moving platforms XYZ. Accurate positioning; the probe bracket feeds the on-chip antenna, and the polarization of the receiving antenna and the transmitting antenna are matched through the rotation of the lower azimuth axis and the polarization axis. Accurate all-round data acquisition; in the lower azimuth axis, the DC servo motor drives the synchronous belt pulley, the synchronous belt pulley drives the worm gear, the worm gear drives the spur gear, and the spur gear drives the sliding guide rail. The on-chip antenna testing device of the present invention solves the problem of antenna feeding, and realizes the ability to test the antenna forward and backward, reduces the influence of the traditional platform on the antenna interference, and realizes the test function of the holographic stereogram of the antenna under test. .

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an on-chip antenna testing device. Background technique [0002] Modern antenna measurement is based on computer applications, mainly including far-field measurement, near-field measurement, and compact field measurement, including antenna principles, mechanical control, high-performance instruments, computer software, and data processing. , Efficiency, intelligence and automation are the general trend of antenna measurement technology development. [0003] The antenna far-field measurement refers to directly obtaining the far-field performance parameters of the antenna in the radiation far-field area of ​​the antenna. In general, the antenna far-field test distance R needs to satisfy R≥2D 2 / λ, D is the maximum size of the antenna aperture, and λ is the working wavelength of the antenna. The traditional far-field antenna test device is mainly a test turntable. According to th...

AI Technical Summary

Problems solved by technology

[0007] At present, with the development of antenna technology, a type of probe-fed on-chip antenna has emerged. With the rapid development of wireless communication, the current test requirements for on-chip antennas are becoming increasingly urgent. Due to the different feeding methods of on-chip antennas, especially In the millimeter wave frequency band, the feed interface is changed from the traditional coaxial waveguide feed to the GSG probe feed, and because the interface size is very small, it must cooperate with CCD and high-precision adjustment devices to complete the feed action, and image 3 Although the scheme shown solves the feeding problem of the antenna under test, it is limited by the limitations of the probe station structure when testing the pattern. It can only test the pattern of the upper half space, and the overall structure of the probe station It will have a certain impact on the electrical performance of the antenna and cause a certain test error, so the traditional connection method can no longer meet the test requirements of the on-chip antenna

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