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Display substrate, manufacturing method thereof and display device

A technology for display substrates and fabrication methods, which are applied in semiconductor/solid-state device manufacturing, electrical components, and electrical solid-state devices, etc., can solve problems such as unsatisfactory results, affecting the performance of glass substrates, and it is difficult to deposit high-quality substrates on glass substrates.

Active Publication Date: 2015-09-16
BOE TECH GRP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this manufacturing method has the following defects: 1. The silicon substrate or sapphire substrate is expensive; 2. The size of the silicon substrate or sapphire substrate is small
[0003] Since epitaxial growth or chemical vapor deposition of nitride needs to be carried out at a high temperature of about 1000 degrees Celsius, and this level of high temperature will affect the performance of the glass substrate, it is impossible to use epitaxial growth or chemical vapor deposition of nitride on the glass substrate. Preparation of GaN LEDs
In order to prepare GaN LEDs on large-sized substrates, the existing technology attempts to use DC magnetron sputtering to form the nitride layer required for GaN LEDs on large-sized substrates, but the results are not satisfactory. The main problem is that the sputtering method is difficult. Formation of high quality single crystal nitride
In order to form high-quality single-crystal nitrides, a thin film with a crystal structure similar to that of the deposited nitrides can be formed on the substrate as the substrate. The commonly used substrate materials are AlN, ZnO, Al 2 o 3 etc., but it is easier to deposit substrates on silicon substrates or sapphire substrates, but it is difficult to deposit high-quality substrates on glass substrates

Method used

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  • Display substrate, manufacturing method thereof and display device
  • Display substrate, manufacturing method thereof and display device
  • Display substrate, manufacturing method thereof and display device

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Experimental program
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Embodiment 1

[0112] This embodiment provides a method for manufacturing a display substrate, including forming a plurality of thin film transistors, and the method further includes:

[0113] forming a lattice matching layer for depositing aluminum nitride on the substrate;

[0114] An aluminum nitride layer is deposited on the lattice matching layer by low-temperature pulse magnetron sputtering;

[0115] A GaN light-emitting diode including an n-type gallium nitride layer, a quantum well multilayer and a p-type gallium nitride layer is formed on the aluminum nitride layer, and the light-emitting diodes correspond to the thin film transistors one by one.

[0116] In this embodiment, a lattice matching layer is first formed on the substrate. The lattice matching layer has a regular and dense atomic sequence arrangement, and a high-quality aluminum nitride layer can be prepared on the lattice matching layer by using low-temperature pulse magnetron sputtering. , and then a GaN light-emitting ...

Embodiment 2

[0159] This embodiment provides a display substrate, including a plurality of thin film transistors, and the display substrate further includes:

[0160] Lattice matching layer;

[0161] an aluminum nitride layer on the lattice matching layer;

[0162] The GaN light-emitting diodes on the aluminum nitride layer include an n-type gallium nitride layer, a quantum well multilayer and a p-type gallium nitride layer, and the light-emitting diodes correspond to the thin film transistors one by one.

[0163] In this embodiment, a lattice matching layer is first formed on the substrate. The lattice matching layer has a regular and dense atomic sequence arrangement, and a high-quality aluminum nitride layer can be prepared on the lattice matching layer by using low-temperature pulse magnetron sputtering. , and then a GaN light-emitting diode including an n-type gallium nitride layer, a multi-layer quantum well and a p-type gallium nitride layer can be prepared on the aluminum nitride ...

Embodiment 3

[0187] This embodiment also provides a display device, including the above display substrate. The display device may be any product or component with a display function such as a display panel, a television, a monitor, a digital photo frame, a mobile phone, a tablet computer, and the like.

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Abstract

The invention provides a display substrate, a manufacturing method thereof and a display device and belongs to the display technical field. The manufacturing method of the display substrate includes the following steps that: a plurality of thin film transistors are formed; a lattice matching layer used for aluminum nitride deposition is formed on a substrate; an aluminum nitride layer is deposited on the lattice matching layer through a low-temperature pulse magnetron sputtering mode; and GaN light emitting diodes containing an n type gallium nitride layer, a quantum well multilayer and a p type gallium nitride layer are formed on the aluminum nitride layer, wherein the light emitting diodes are in one-to-one correspondence with the thin film transistors. With the above technical schemes of the invention adopted, a GaN LED can be prepared on a large-sized substrate.

Description

technical field [0001] The present invention relates to the field of display technology, in particular to a display substrate, a manufacturing method thereof, and a display device. Background technique [0002] Existing GaN LEDs (Light Emitting Diodes) are fabricated on atomically flat silicon substrates or sapphire substrates based on epitaxial growth or chemical vapor deposition. However, this manufacturing method has the following defects: 1. The silicon substrate or the sapphire substrate is expensive; 2. The silicon substrate or the sapphire substrate is small in size. The above-mentioned defects limit the size and cost of displays using GaN LEDs. How to fabricate GaN LEDs on cheap, large-area substrates (such as glass substrates) has become an urgent problem to be solved. [0003] Since epitaxial growth or chemical vapor deposition of nitride needs to be carried out at a high temperature of about 1000 degrees Celsius, and this level of high temperature will affect th...

Claims

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Application Information

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IPC IPC(8): H01L21/02H01L27/15H01L33/00
CPCH01L27/156H01L27/1222H01L27/1248H01L27/1259H01L29/66765H01L29/78678H01L33/0066H01L33/32H01L21/02422H01L21/02444H01L21/0254H01L21/02631H01L33/0075
Inventor 江峰周莉王龙刘兴东李重君
Owner BOE TECH GRP CO LTD