Residual stress layer-depth distribution assistant measuring device and residual stress layer-depth distribution assistant measuring method

Abstract

The invention discloses a residual stress layer-depth distribution assistant measuring device which includes a bottom supporting device, a workpiece supporting device, a sensor support and a displacement sensor. The bottom supporting device includes a pedestal, two guide rails, a servo motor and a ball screw mechanism. The workpiece supporting device includes a connection board, a V-shaped piece and a workpiece position limiting mechanism. The workpiece position limiting mechanism includes a position limiting frame mounted on the connection board and a pressing apparatus mounted on the position limiting frame. The pressing apparatus is disposed above the V-shaped piece. The sensor is mounted on the pedestal. The displacement sensor is installed on the sensor support in a manner of being adjustable in vertical direction and is used for detecting the depth of a to-be-detected zone through contact with the to-be-detected zone on the V-shaped piece. The device is automatically controllable during the whole processes of stripping and measurement, is strong in operability, can save measurement time and is high in measurement precision.

Description

technical field [0001] The invention belongs to the field of component residual stress measurement equipment, and more specifically relates to an auxiliary measurement device and method for residual stress layer depth distribution. Background technique [0002] Residual stress is the self-balancing stress that remains inside the solid after the external load is removed. The residual stress of machining comes from the non-uniform material deformation caused by mechanical load, temperature gradient, phase transition, etc. during machining. The size and distribution of residual stress directly affect the fatigue life, creep life and corrosion resistance of parts. Therefore, the measurement of the distribution of residual stress along the depth of the layer is of great significance. At present, X-ray diffraction is the most widely used technical method to measure residual stress. X-ray penetration is very weak, and electrolytic stripping is needed to realize the measurement of ...

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Problems solved by technology

[0004] In view of the above defects or improvement needs of the prior art, the present invention provides an auxiliary measuring device and method for residual stress layer depth distribution, the purpose of which is to provide a highly accurate and efficient measuring device and method for controlling the peeling depth, so that Accurate and efficient measurement of residual stress distributed at different depths, with strong operability and greatly improved measurement efficiency, thus solving the defect that the peeling depth is not easy to control in the prior art

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