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Detector splicing real-time image registration method

A real-time image and detector technology, applied in image data processing, graphics and image conversion, instruments, etc., can solve problems such as the complexity of the registration process, achieve the effects of improving estimation efficiency, good real-time performance, and avoiding mismatching phenomena

Inactive Publication Date: 2015-11-18
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] In order to solve the problems that existing image registration methods are easily affected by image noise, light intensity and overlapping areas, etc., and the registration process is complicated, etc., the present invention provides a real-time image registration method for detector splicing

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specific Embodiment approach 1

[0021] Specific implementation mode 1. Combination Figure 1 to Figure 7 Describe this embodiment, the detector mosaic real-time image registration method, this method is realized by the following steps:

[0022] Step 1. Calibration of the splicing and overlapping areas of the detectors. Using the angle compensation principle based on the electronic theodolite, a calibration device for the spatial position of the detectors is constructed to complete the precise calibration of the splicing and overlapping areas of adjacent detectors;

[0023] Step two, image feature detection and extraction. Input reference image I 1 and the image to be registered I 2 , complete the preprocessing of the distortion correction of the input image, and use the CUDA-based fast robust feature (SURF) method to detect and extract the feature points of the overlapping area of ​​the two images.

[0024] Step 3, image feature point matching. The basic linear algebra operation subroutine (CUBLAS) is us...

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Abstract

A detector splicing real-time image registration method relates to the technical field of photoelectric image processing. The problems of the existing image registration method, for example, image registration is easily affected by image noise, light intensity, overlap area and the like, and the registration process is complex, are solved. By calculating the splicing imaging overlap area based on the calibration result, the efficiency of feature detection is improved. Based on the calibration result, a matrix model adopted for registration transformation can be selected in a targeted manner. A candidate feature point set of an overlap area image is detected and extracted by a CUDA-based SURF method. Then, initial matching point pairs are acquired by using a CUBLAS accelerated ANN algorithm based on stochastic KD-Tree indexing. A PROSAC algorithm based on global optimization is adopted to eliminate falsely matched point pairs and estimate parameters of a spatial transformation matrix. By adopting the method, an image registration result with better real-time performance, higher precision and stronger robustness is obtained.

Description

technical field [0001] The invention relates to the technical field of photoelectric image processing, in particular to a detector mosaic real-time image registration method, which can also be used in technical fields such as micro-scan imaging motion parameter estimation, computer vision and pattern recognition, and video monitoring target tracking. Background technique [0002] Image registration is the process of optimally matching the overlapping areas of two or more images in the same scene. The core issue is how to ensure the speed, accuracy and stability of registration. [0003] At present, image registration methods are roughly divided into two categories according to the available registration objects extracted from images: registration methods based on gray information and registration methods based on feature information. The registration method based on gray information is easily affected by image noise, illumination intensity and overlapping area size, which li...

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Application Information

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IPC IPC(8): G06T3/00
CPCG06T3/14
Inventor 王新华黄玮张广贾树强范洪杰
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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