Spacecraft system-level single event upset effect analysis method based on fault propagation

A single event flipping and fault propagation technology, applied in the field of spacecraft, can solve problems such as the difficulty in optimizing the design of radiation-resistant reinforcement and the lack of impact analysis of single event effects, and achieve significant practical significance and engineering value.

Inactive Publication Date: 2015-12-02
SHANGHAI SATELLITE ENG INST
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Problems solved by technology

[0006] The technical problem to be solved by the present invention is: Aiming at the problem that the single event effect of aerospace products lacks the impact analysis at the system level, thus resulting in the difficulty in the optimization design of the system's radiation resistance reinforcement, a single event flipp

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  • Spacecraft system-level single event upset effect analysis method based on fault propagation
  • Spacecraft system-level single event upset effect analysis method based on fault propagation
  • Spacecraft system-level single event upset effect analysis method based on fault propagation

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Embodiment Construction

[0059] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0060] The present invention provides a method for analyzing the impact of single event upset at the spacecraft system level based on fault propagation, including: space radiation environmental effect assessment, system single event fault propagation modeling, and single event upset at the device level, stand-alone level and system level Failure rate calculation. The invention solves the systematic and quantitative problem of evaluating the impact of single event effects on sensitive systems during the ...

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Abstract

The present invention provides a spacecraft system-level single event upset effect analysis method based on fault propagation. The method comprises spatial radiation environmental effect estimation, system single event fault propagation modeling and device-level, single-machine-level and system-level oriented single event upset fault rate calculation. The method solves the systematic and quantitative problems of estimating the effect of a single event effect on a sensitive system during existing spacecraft design and can provide a necessary reference for selection of spacecraft components and optimization of an anti-radiation design scheme of a single machine and a system.

Description

technical field [0001] The present invention relates to the technical field of spacecraft, in particular to a method for analyzing the impact of single-event flipping at the system level of a spacecraft. Background technique [0002] In recent years, with the development of aerospace technology and the continuous improvement of product indicators, microelectronic devices with small size and low power consumption, such as FPGAs, DSPs and other ultra-large-scale devices, have been more and more widely used in aerospace engineering. In space, these key devices are affected by high-energy charged particles from galactic cosmic rays, solar cosmic rays, and the earth's radiation belt, and are prone to single-event effects (such as single-event upset (SEU), single-event lock-in (SEL), single-event Burnout (SEB), single event gate breakdown (SEGR), etc., among which the single event reversal effect is the most common), resulting in transient disturbance or even permanent damage to t...

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Application Information

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IPC IPC(8): G06F19/00
Inventor 李庆韦锡峰杨少秋宗益燕
Owner SHANGHAI SATELLITE ENG INST
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