Spacecraft system-level single event upset effect analysis method based on fault propagation

Abstract

The present invention provides a spacecraft system-level single event upset effect analysis method based on fault propagation. The method comprises spatial radiation environmental effect estimation, system single event fault propagation modeling and device-level, single-machine-level and system-level oriented single event upset fault rate calculation. The method solves the systematic and quantitative problems of estimating the effect of a single event effect on a sensitive system during existing spacecraft design and can provide a necessary reference for selection of spacecraft components and optimization of an anti-radiation design scheme of a single machine and a system.

Description

technical field [0001] The present invention relates to the technical field of spacecraft, in particular to a method for analyzing the impact of single-event flipping at the system level of a spacecraft. Background technique [0002] In recent years, with the development of aerospace technology and the continuous improvement of product indicators, microelectronic devices with small size and low power consumption, such as FPGAs, DSPs and other ultra-large-scale devices, have been more and more widely used in aerospace engineering. In space, these key devices are affected by high-energy charged particles from galactic cosmic rays, solar cosmic rays, and the earth's radiation belt, and are prone to single-event effects (such as single-event upset (SEU), single-event lock-in (SEL), single-event Burnout (SEB), single event gate breakdown (SEGR), etc., among which the single event reversal effect is the most common), resulting in transient disturbance or even permanent damage to t...

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Problems solved by technology

[0006] The technical problem to be solved by the present invention is: Aiming at the problem that the single event effect of aerospace products lacks the impact analysis at the system level, thus resulting in the difficulty in the optimization design of the system's radiation resistance reinforcement, a single event flipping fault propagation model of the spacecraft system is established, and based on this In the above, considering the system composition and the single event upset protection measures adopted by the system, the calculation method of the single event upset failure rate is given from the device, stand-alone and system levels

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