Microwave plasma torch atomic emission spectrometer

Abstract

The invention provides a microwave plasma torch atomic emission spectrometer; a microwave source system of the microwave plasma torch atomic emission spectrometer can produce high-power, continuous and stable microwaves, the power is adjustable in the range of 0-1500 W, microwave output stability is high, the high-power microwaves are coupled to a matched high-power microwave plasma torch light source system, the ability to stimulate plasma is stronger, plasma is not easily damaged by a solvent, and a sample solution can be directly atomized for sample introduction, so that a heating solvent-removing device is omitted, a sample introduction system of the instrument is greatly simplified, the reliability of the instrument is improved, a generated plasma light source is more conducive to capture and detect in a spectroscopic detection system, generated spectral analysis data have better effects when used in element analysis, and the whole machine performance is improved.

Description

technical field [0001] The invention belongs to the field of sample element component detection, and in particular relates to a microwave plasma torch atomic emission spectrometer used to form a plasma light source for spectrum analysis technology. Background technique [0002] In the field of atomic emission spectrometry, the commonly used technology is inductively coupled plasma (ICP) atomic emission spectrometry. Spectrometers based on this technology have been widely used, and the types and models of instruments are also very diverse, including sequential scanning , full-spectrum direct-reading type, etc., the overall performance meets the needs of scientific research and applications. However, the inductively coupled plasma spectrometer is expensive, and the operation and maintenance costs are high, so it is not very suitable for general institutions of higher learning and small and medium-sized enterprises. In addition, the determination of non-metallic elements such ...

AI Technical Summary

Problems solved by technology

[0004] However, the power range of the microwave source system of the above two spectrometers is between 0-300W, which belongs to the low-power category. Compared with the kilowatt-level ICP, the plasma excitation ability is still limited, and the plasma at low power is resistant to solvent water. The force is low, and it is necessary to add a desolvation system to the sampling system to remove the moisture contained in the wet aerosol. The commonly used sampling system atomizes the sample, heats it to vaporize, and then condenses it with water + concentrated sulfuric acid to achieve desolvation.

Concentrated sulfuric acid is inconvenient to operate and replace, the glass condenser is fragile, and the construction must be careful, the airtightness is not good, the long-term stability of sample analysis cannot be guaranteed, and the performance of the whole machine is low

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