Double-constant current source structure-based high-resolution fast time interval measurement circuit

A time interval measurement, high-resolution technology, applied in electrical unknown time interval measurement, devices and instruments for measuring time interval, etc., can solve problems such as difficulty in meeting waveform reconstruction efficiency requirements

Inactive Publication Date: 2016-01-27
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

For the RC circuit to really reach a stable state, it often takes about 5τ, that is, about 5ms, whi...

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  • Double-constant current source structure-based high-resolution fast time interval measurement circuit
  • Double-constant current source structure-based high-resolution fast time interval measurement circuit
  • Double-constant current source structure-based high-resolution fast time interval measurement circuit

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Embodiment Construction

[0025] Specific embodiments of the present invention will be described below in conjunction with the accompanying drawings, so that those skilled in the art can better understand the present invention. It should be noted that in the following description, when detailed descriptions of known functions and designs may dilute the main content of the present invention, these descriptions will be omitted here.

[0026] In this example, if image 3 As shown, the present invention is a high-resolution fast time interval measurement circuit based on a double constant current source structure, including: charging and discharging capacitor C1, discharging constant current source, charging constant current source, voltage stabilizing circuit and diode D1. One end of the charge and discharge capacitor C1 is grounded, and the other end is a charge and discharge end.

[0027] The discharge constant current source and the charge constant current source form a double constant current source ...

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Abstract

The invention discloses a double-constant current source structure-based high-resolution fast time interval measurement circuit. Based on a time-to-amplitude converter, a double-constant current source structure composed of a discharging constant current source and a charging constant current source is adopted, and a charging and discharging capacitor is charged through the charging constant current source, so that the voltage of the charging and discharging capacitor can return to initial voltage. According to the double-constant current source structure-based high-resolution fast time interval measurement circuit of the invention, the charging constant current source has two kinds of working states; and under the control of on-off control signals, the magnitude of the charging current of the charging constant current source can be changed, namely, the charging constant current source optionally generates micro current according to measuring process requirements in an initial preparation measuring phase, a discharging phase and an ADC sampling stage, and so as to provide stable initial voltage for the charging and discharging capacitor in the initial preparation measuring phase, and after measurement is completed, the charging constant current source optionally generates high current to charge the charging and discharging capacitor, so that the voltage of the charging and discharging capacitor can be restored rapidly, and therefore, time interval measurement speed can be improved. With the double-constant current source structure-based high-resolution fast time interval measurement circuit adopted, the time interval measurement speed can be improved greatly with measurement accuracy ensured, and therefore, random equivalent sampling waveform reconstruction efficiency can be further improved.

Description

technical field [0001] The invention belongs to the technical field of time interval measurement, and more specifically relates to a high-resolution fast time interval measurement circuit based on a double constant current source structure. Background technique [0002] In a random sampling oscilloscope, the processor reorders the waveforms acquired by multiple triggers according to the positions of the trigger points, so as to realize the reconstruction of the measured waveform. The waveform reconstruction is based on the time interval ΔT between each trigger moment and the rising edge of the next data synchronization clock after the trigger, the trigger signal and data synchronization clock are sent to the time interval measurement circuit, the trigger signal and the data synchronization clock from the ADC Perform XOR to generate a narrow pulse carrying time interval information ΔT, and this time interval enters the time-to-amplitude conversion (Time-to-amplitude Converter...

Claims

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Application Information

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IPC IPC(8): G04F10/00
CPCG04F10/00
Inventor 邱渡裕谭峰叶芃曾浩吴佳瑜魏骐
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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