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Segmental linear calibration system and method for temperature sensor chip

A temperature sensor, piecewise linear technology, applied in the field of measurement, can solve the problem that the accuracy cannot guarantee the chip accuracy requirements, and achieve high-precision requirements and high-precision effects

Inactive Publication Date: 2016-02-24
SHENZHEN BOJUXING IND DEV
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  • Summary
  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the working temperature is required to be wide, the limitations of this solution are more obvious
Especially when the temperature sensor chip needs to be applied to a wide temperature measurement environment, such as some applications require the temperature sensor chip to work at -40°C ~ +85°C, the accuracy of this solution cannot guarantee that the chip can meet the accuracy requirements in the entire operating temperature range

Method used

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  • Segmental linear calibration system and method for temperature sensor chip
  • Segmental linear calibration system and method for temperature sensor chip
  • Segmental linear calibration system and method for temperature sensor chip

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Embodiment 1

[0022] see Figure 4 , in an embodiment of the present invention, a piecewise linear calibration system for a temperature sensor chip, wherein the temperature sensor chip includes a temperature sensor front end, an ADC, a linear conversion circuit, and a ROM, and the system includes a calibration temperature point register, a comparator , function calculator, intercept register, slope register, intercept data selector MUX, slope data selector MUX, the number of intercept register and slope register is N-1, and the number of calibration temperature point register and comparator is N-2, N is an integer not less than 5, the calibration temperature point register is connected to the comparator one by one, N-2 comparators are connected to the function calculator, the intercept register is connected to the intercept data selector MUX, and the slope register Connect with the slope data selector MUX, the intercept data selector MUX, and the slope data selector MUX are respectively con...

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Abstract

The invention discloses a segmental linear calibration system and method for a temperature sensor chip. The system comprises N-2 calibration temperature point registers, N-2 comparators, a function calculator, N-1 intercept registers, N-1 slope registers, an intercept data selector and a slope data selector, wherein N is an integer not smaller than 5; the calibration temperature point registers and the comparators are connected in a one-to-one correspondence manner; the comparators are connected with the function calculator; the intercept registers are connected with the intercept data selector; the slope registers are connected with the slope data selector; the intercept data selector and the slope data selector are connected with the function calculator respectively, the intercept A and the slope S which correspond to calibration temperature points are obtained through calculation and are transmitted to a linear conversion circuit of the temperature sensor chip. With the adoption of the method, the higher precision requirement can be met in the wider working temperature range.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to a segmented linear calibration system and method for temperature sensor chips. Background technique [0002] A temperature sensor is a device that converts ambient temperature into an output signal. The temperature sensor chip mainly includes three parts: the front end of the temperature sensor, the ADC, and the linear conversion circuit; the front end of the temperature sensor can convert the ambient temperature into an analog voltage signal, and then sample it through the ADC to obtain the sampled digital signal X; the digital signal X and the temperature T The relationship between them is close to a linear relationship, and the temperature T is calculated by a linear conversion circuit. [0003] Existing methods for calibrating temperature sensor chips such as figure 1 As shown, the scheme utilizes the characteristic that the relationship between the digital signal X an...

Claims

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Application Information

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IPC IPC(8): G01K15/00
CPCG01K15/005
Inventor 万上宏叶媲舟黎冰涂柏生
Owner SHENZHEN BOJUXING IND DEV
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