Unlock instant, AI-driven research and patent intelligence for your innovation.

A kind of IC card electrostatic testing device and testing method

An electrostatic test and voltage technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problem of low output accuracy of electrostatic discharge generators, and achieve the goal of improving output stability, improving stability, and high output stability Effect

Active Publication Date: 2018-08-17
STATE GRID SICHUAN ELECTRIC POWER CORP ELECTRIC POWER RES INST +2
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] The present invention is to overcome the defect that the output precision of the electrostatic discharge generator in the prior art is not high, and according to one aspect of the present invention, an IC card electrostatic testing device is proposed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A kind of IC card electrostatic testing device and testing method
  • A kind of IC card electrostatic testing device and testing method
  • A kind of IC card electrostatic testing device and testing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0053] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.

[0054] According to an embodiment of the present invention, an IC card electrostatic testing device is provided, figure 2 It is a structural diagram of the device, specifically including: DA conversion circuit 10, positive high-voltage power supply 20, negative high-voltage power supply 30, power switch SW1, charging and discharging switch SW2, charging capacitor C1, first resistor R1, and second resistor R2.

[0055] see figure 2 As shown, the input terminal DIN of the DA conversion circuit 10 is used to receive the control voltage signal generated by the PLC. The control voltage signal is determined by the PLC according to the actual output voltage value of the high voltage probe during the high voltage test. The c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an IC card static test device and a test method. The test device comprises a DA converting circuit, a positive high-voltage power supply, a negative high-voltage power supply, a power change-over switch, a charging / discharging switch, a charging capacitor, a first resistor and a second resistor. The positive voltage output end of the DA converting circuit is connected with the input end used for generating positive high-voltage power for the positive high-voltage power supply. The negative voltage output end is connected with the input end used for generating negative high-voltage power for the negative high-voltage power supply. The output end of the positive high-voltage power supply is connected with the first input end of the power change-over switch. The output end of the negative high-voltage power supply is connected with the second input end of the power change-over switch. The output end of the power change-over switch is connected with the normally-closed input end of the charging / discharging switch through the first resistor. The output end of the charging / discharging switch is connected to the ground via the charging capacitor. The normally-opened input end of the charging / discharging switch is connected with a high-voltage probe via the second resistor. According to the invention, by using the two high-voltage power supplies, output stability and output precision are improved.

Description

technical field [0001] The invention relates to the technical field of IC card testing, in particular to an IC card electrostatic testing device and testing method. Background technique [0002] Electrostatic discharge (ESD) refers to the phenomenon that when the field strength around the charged body exceeds the insulation breakdown field strength of the surrounding medium, the electrostatic charge on the charged body disappears partially or completely due to the ionization of the medium. Electrostatic discharge is a high potential, strong electric field And the process of instantaneous high current. [0003] For the electrostatic discharge of the human body, it is known through experiments that the minimum discharge energy can also reach 3.12×10 -4 joule. The peak value of the instantaneous discharge current can reach more than several amperes. [0004] The IC card used in the power industry is an electronic circuit that is more sensitive to electrostatic discharge. Due...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/001
Inventor 吴维德龙海莲向景睿罗银康金鑫吴勇王伟陈旭曾世杰李嘉
Owner STATE GRID SICHUAN ELECTRIC POWER CORP ELECTRIC POWER RES INST