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Ion structure analysis method

A technology of ions and analyzers, applied in the direction of analyzing materials, material analysis by electromagnetic means, special data processing applications, etc., can solve the problems of reducing analysis efficiency and increasing analysis costs

Inactive Publication Date: 2016-03-23
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the ion mobility spectrometry method increases the analysis cost and reduces the analysis efficiency

Method used

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Embodiment Construction

[0038] Specific embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be understood that the specific embodiments are merely illustrative examples and should not be construed as limitations of the present invention.

[0039] see Figure 1 to Figure 4 . In the method for analyzing ion structure according to an embodiment of the present invention, sample ion parameters: it contains at least two isomer samples with a mass-to-charge ratio of m / z=524, which are respectively large ions and small ions, wherein the small Ion size (expressed by small ion effective radius r1) r1=0.883nm, collision cross-sectional area is π(r1) 2 , large ion size (represented by small ion effective effective radius r2) r2=2.883nm, collision cross-sectional area is π(r2) 2 . The method comprises the steps of:

[0040] Steps of trapping and exciting ions: applying a radio frequency electric field (RF) to an ion mass analyzer with a ...

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Abstract

The present invention relates to an ion structure analysis method, which comprises: imprisoning and exciting ions, wherein a radio frequency electric field with a high-order component is applied onto an ion mass analyzer, and an auxiliary alternating current electric field or a broadband excitation electric field is applied onto the ion mass analyzer to make the sample ions be excited to achieve a certain motion amplitude, wherein the motion amplitude does not exceed the imprisoning capacity of the ion mass analyzer, and is recorded as the initial motion amplitude, and the moment is recorded as the first moment; carrier gas is continuously introduced into the ion mass analyzer, and a certain vacuum degree in the ion mass analyzer is maintained, wherein the sample ions collide with the carrier gas, the motion amplitude gradually reduced until a second moment is achieved, and the time domain signal of the image current produced by the sample ions during the process from the first moment to the second moment is collected; and signal processing is performed, wherein the time domain signal is analyzed by using a time frequency analysis method to obtain the time change characteristic curve containing the corresponding relation between the corresponding size ion motion frequency and the ion and carrier gas collision cross section area so as to distinguish the ions having different sizes.

Description

technical field [0001] The invention relates to a method for analyzing ion structure, in particular to a method applicable to Fourier transform equipment and analyzing the ion structure by measuring the collision cross-sectional area. Background technique [0002] Mass spectrometry is an analytical method that separates and detects compounds according to different mass-to-charge ratios (m / z) to identify components and structures. Due to its high specificity and sensitivity, mass spectrometry plays an increasingly important role in the field of biological analysis. Bio-mass spectrometry (Bio-MS) is a mass spectrometry technique applied to the analysis of biomolecules. and disulfide bond positioning, protein post-translational modification, quantitative proteome analysis, protein interaction studies, etc. In addition, biological mass spectrometry is also used in polysaccharide structure determination, oligonucleotide and nucleic acid analysis, microbial identification, drug ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/62G06F19/00
Inventor 徐伟贺木易方向
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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