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Base inspection device and method for FOUP (Front Opening Unified Pod)

A wafer transfer box and inspection device technology, which is used in optical device exploration, semiconductor/solid-state device testing/measurement, etc., can solve problems such as inability to lock threaded parts, handling equipment failure, and inconvenience, and reduce human inspection errors. The probability and the effect of saving the time of inspection

Inactive Publication Date: 2016-03-23
MICRON TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the operator misuses the wrench, the threaded parts may not be locked
During the process of the FOUP being transported, the unlocked screw parts may loosen, which may cause the failure of the transporting equipment
[0004] In addition, operators can only visually or manually confirm whether each threaded part has been locked.
However, due to the large number of threaded holes, it is quite cumbersome and inconvenient for operators to confirm whether each threaded part has been locked one by one.

Method used

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  • Base inspection device and method for FOUP (Front Opening Unified Pod)
  • Base inspection device and method for FOUP (Front Opening Unified Pod)
  • Base inspection device and method for FOUP (Front Opening Unified Pod)

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Embodiment Construction

[0052] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Hereinafter, the present invention will be described in detail by illustrating embodiments of the invention with the accompanying drawings, and the same reference numerals in the drawings may be used to denote similar elements. The aforementioned and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of the embodiments with reference to the accompanying drawings.

[0053] The directional terms mentioned in the following embodiments, such as: "upper", "lower", "front", "rear", "left", "right", etc., are only referring to the directions of the accompanying drawings. Accordingly, the directional terms used are illustrative, not limiting, of the invention. Moreover, in the following embodiments, the same reference numerals are used to denote the same or si...

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Abstract

The present invention provides a base inspection device and method for an FOUP (Front Opening Unified Pod). The base inspection device comprises an image acquisition unit, a locking assembly and a processing unit; wherein the processing unit is electrically connected with the image acquisition unit and the locking assembly; the image acquisition unit is movably arranged at the lower side of a base, so as to acquire an opening image of at least one opening. The image acquisition unit acquires the image of the opening through control of the processing unit, and judges whether each opening contains a screw element therein. The locking assembly is adjacent to the image acquisition unit and is movably arranged at the lower side of the base. When each opening contains the screw element therein, the locking assembly inspects whether each screw element is locked through control of the processing unit.

Description

technical field [0001] The present invention relates to a base inspection device and method of a Front Opening Unified Pod (FOUP), in particular to a device and method capable of inspecting the locking status of a plurality of screw parts on the base of a Front Opening Unified Pod. Background technique [0002] In semiconductor manufacturing processes, wafers are usually placed in a wafer transfer pod (FOUP) for handling or storage. The wafer transfer box has a chamber and a base, in which the chamber is used to isolate the wafer from the environment around the wafer frame to avoid contamination of the wafer, and is fixed on the wafer loader (LoadPortUnit, LPU) through the base on the stage. The base is usually provided with a plurality of threaded holes, so that the base and the chamber can be fixed to each other by using a plurality of threaded parts. [0003] In the prior art, manual work is still used to fix the base to the bottom of the chamber by means of screws. Si...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/66G01V8/10
Inventor 梁志诚黄元俊
Owner MICRON TECH INC
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