Super-resolution array scanning structure light illumination imaging apparatus and imaging method thereof

A technology of structured light illumination and imaging device, which is applied in the direction of measurement device, material analysis, material analysis through optical means, etc., can solve the problem of low measurement efficiency, achieve high measurement efficiency, increase the spatial cut-off frequency, and broaden the spatial frequency domain The effect of bandwidth

Active Publication Date: 2016-04-13
HARBIN INST OF TECH
View PDF7 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the problem that the microscopic imaging technology in the prior art can only measure thinner biological samples. When measuring thicker samples, as the incident distance increases, the diffracted light incident by parallel light is significantly affected by the scattering effect , the problem of low measurement efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Super-resolution array scanning structure light illumination imaging apparatus and imaging method thereof
  • Super-resolution array scanning structure light illumination imaging apparatus and imaging method thereof
  • Super-resolution array scanning structure light illumination imaging apparatus and imaging method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] The specific embodiment of the present invention is described in conjunction with the accompanying drawings. A super-resolution array scanning structured light illumination imaging device of the present invention includes an LED light source 1, and is characterized in that an AOM acousto-optic modulator 2, Collimating beam expander 3, scanning system 4, microlens array 5, collimating lens 6, beam splitting prism 8, 1 / 4 wave plate 10, illumination objective lens 11, sample 12, collecting lens 7, CCD detector 9 and data acquisition Card; the product of the modulation period T of the acousto-optic modulator AOM and the scanning speed v of the scanning point on the sample surface And the distance between the centers of adjacent lighting spots is an integer multiple of the space period of the lighting light field.

[0043] The LED light source is an incoherent light source, the illumination of the sample is incoherent illumination, and the entire imaging process is incohere...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an imaging apparatus and an imaging method thereof, and concretely relates to a super-resolution array scanning structure light illumination imaging apparatus and an imaging method thereof. The purpose of the invention is to solve the problems of only measurement of a thin biological sample through a microscopic imaging technology, obvious influences of the scattering effect on incident diffracted lights of parallel lights, and low measurement efficiency in the prior art. The apparatus comprises an LED light source, and a light intensity modulator, a collimating beam expander, a scanning system, a microlens array, a collimating lens, a light splitting prism, a 1 / 4 wave plate, an illumination objective lens, a sample, a collecting lens, a CCD light intensity detector and a data collection card are sequentially arranged along the light propagation direction of the LED light source; and detection light spots obtained after every scanning are directly superposed on an image plane to obtain initial detection data, illumination scanning in different phases is carried out three times in every direction, and a super-resolution image is obtained through image reconstruction. The apparatus and the method widen the spatial frequency domain bandwidth, and are suitable for being used in the measurement fields of industrial morphology and imaging of thick biological samples.

Description

technical field [0001] The invention relates to an imaging device and an imaging method thereof, in particular to a super-resolution array scanning structured light illumination imaging device and an imaging method thereof, belonging to the technical field of optical compact measurement. Background technique [0002] Optical microscopy is a long-established and important non-destructive technique widely used in fields such as biology and materials science. Structured Illumination Microscopy (SIM) was proposed by American scientist Gustafsson in 2000. Its principle is similar to the Moiré fringe principle. By modulating the illumination function of a wide-field microscope, the optical intensity transfer function (OTF) of the entire optical system is translated. and superposition, so that the frequency domain bandwidth of the system increases and the cutoff frequency increases. Usually, a sinusoidal grating is used to change the illumination intensity distribution of the wide...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01
CPCG01N21/01
Inventor 邹丽敏张甦王宝凯谭久彬
Owner HARBIN INST OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products