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Small flash memory based measurement device and method

A test device, flash memory technology, applied in static memory, instruments, etc., can solve problems such as large differences in levels, complicated operations, and large equipment volume, and achieve the effects of improving work efficiency, small footprint, and high portability

Inactive Publication Date: 2016-04-13
苏州科美信息技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] NandFlash is shipped from chip suppliers to various sales channels, and the grades vary greatly. In addition, the phenomenon of shoddy products abounds. NandFlash testing equipment is generally only available to large enterprises, and the equipment is bulky, complicated to operate, and low in testing efficiency. , not portable

Method used

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  • Small flash memory based measurement device and method
  • Small flash memory based measurement device and method

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Experimental program
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Embodiment

[0031] Such as figure 1 , figure 2 Shown, a kind of test device based on small flash memory, comprises test base 1, and first test base 2 and second test base 3 are installed on described test base 1, and flash memory is also arranged on described test base 1 Detection control unit 4, the output end of the first test socket 2 and the output end of the second test socket 3 are all connected to the detection end of the flash memory detection control unit 4, and the control terminal of the flash memory detection control unit 4 is connected to the flash memory test mode Configuration unit 5 input ends are connected, also link to each other with the input end of flash memory model configuration unit 6, also link to each other with the input end of flash memory test state indication unit 7, and also link to each other with the input end of flash memory classification indication unit 8, described flash memory detection control The feedback end of unit 4 is also connected with the o...

Embodiment 1

[0050] In Embodiment 1, the present invention provides a method based on small flash memory testing, which detects that the first test seat is a thin small size package (TSOP) test seat, and the detection workflow is as follows:

[0051] S1: placing the undetected flash memory on the first test socket (thin small size package);

[0052] S2: the flash memory detection control unit 4 detects the undetected flash memory placed in S1;

[0053] S3: After passing through S2, the control terminal in the flash memory detection control unit 4 controls respectively the flash memory test mode configuration unit 5, the flash memory model configuration unit 6, the flash memory test state indication unit 7 and the flash memory classification indication unit 8 to the undetected flash memory card to test;

[0054] S4: After S3 detection, the respective output terminals of the flash memory test mode configuration unit 5, the flash memory model configuration unit 6, the flash memory test state...

Embodiment 2

[0059] In Embodiment 2, the present invention provides a method based on small flash memory testing, and the second test seat 3 is tested as a solder ball array package (BGA or LGA) test seat, and the detection workflow is as follows:

[0060] It is the same as the detection method in the first embodiment above, except that only the flash memory on the second test socket 3 can be tested only, and all the flash memory in ball array package (BGA or LGA) can be tested and classified.

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Abstract

The invention relates to a small flash memory based measurement device and method. A measurement base is provided with a first measurement seat and a second measurement seat; the output end of the first measurement seat and the output end of the second measurement seat are both connected with the detection end of a flash memory detection control unit; the control end of the flash memory detection control unit is respectively connected with the input end of a flash memory testing mode configuration unit, the input end of a flash memory model configuration unit, the input end of a flash memory testing state indication unit and the input end of a flash memory classifying indication unit; the feedback end of the flash memory detection control unit is connected with the output end of the flash memory testing mode configuration unit, the output end of the flash memory model configuration unit, the output end of the flash memory testing state indication unit and the output end of the flash memory classifying indication unit; and the output end of the flash memory detection control unit is connected with the input end of PC. The small flash memory based measurement device has efficiency through combination of miniaturization, automation and reliability, thereby improving high efficiency of detection.

Description

technical field [0001] The invention relates to a test device, in particular to a test device and method based on a small flash memory. Background technique [0002] NandFlash is shipped from chip suppliers to various sales channels, and the grades vary greatly. In addition, the phenomenon of shoddy products abounds. NandFlash testing equipment is generally only available to large enterprises, and the equipment is bulky, complicated to operate, and low in testing efficiency. , is not portable. For enterprises, it is necessary to purchase a large number of test equipment to test the quality of the purchased NandFlash chips. The test equipment occupies a small space, is easy to operate, has high test efficiency, and is very important to have reliability. For NandFlash chip level and bad block testing, a NandFlash testing equipment with small size, simple operation and high testing efficiency can provide a better solution for NandFlash testing. [0003] In view of the above-m...

Claims

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Application Information

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IPC IPC(8): G11C29/56
CPCG11C29/56008G11C29/56016
Inventor 黄程张朋张誉丹陈光第
Owner 苏州科美信息技术有限公司
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