Data reliability discrimination method in high-speed digital acquisition

Abstract

The invention relates to a data reliability discrimination method in high-speed digital acquisition. The method includes the following steps that: 1) whether relevant software and hardware components are consistent with expected states are checked; 2) data signals are acquired, signal waveform data are obtained, and the rise time of the signal waveform data is calculated; 3) transmission delay signals are inputted from the outside, and the rise time of the transmission delay signals is calculated; 4) the rise time of the signal waveform data is compared with the rise time of the transmission delay signals, whether the signal waveform data are high-speed signals is judged; 5) the analog bandwidth of an amplifier is read, the reflection frequency of the transmission delay signals is calculated, and whether the bandwidth of external input acquisition equipment is proper is judged; 6) the current sampling rate of the amplifier is obtained, the number of sampling points is calculated, each sampling interval is determined, the slope Tan gamma of the acquired signal waveforms of a straight line from 0 to Vpp in an interval [0,Tr] is calculated, the slope Tan alpha of the acquired signal waveforms between two adjacent sampling points in the interval [0,Tr] is calculated, the difference of the Tan gamma and the Tan alpha is obtained, whether the difference satisfies the expression that Tan gamma-Tan alpha<=+-1 is judged. With the method of the invention adopted, misjudgment can be avoided effectively, and the reliability of test results can be increased.

Description

technical field [0001] The present invention relates to a kind of method that is used for automatic test equipment / system (ATE / ATS, AutomaticTestEquipment / System) or other test equipment to analyze the signal under test and process the discrete data collected in the working process, especially relates to a In the high-speed digital circuit test, the test data is preprocessed to improve the accuracy of the data, and the method for judging the reliability of the data in the high-speed digital acquisition. Background technique [0002] The test requirements of high-speed digital circuits account for an increasing proportion of the entire test requirements, so the design technology of high-speed digital acquisition systems is one of the core technologies of automatic test equipment / systems. [0003] When designing a high-speed digital acquisition system, due to the asynchronous relationship between the acquisition system and the system under test, the sampling point sometimes ha...

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Problems solved by technology

[0004] At present, the usual situation is that in the design of high-speed digital acquisition system, there is no effective control method and solution to the misjudgment problem that may be caused by the collected discrete data.

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