A multi-channel time-interleaved ADC measurement calibration method and device
A technology of time interleaving and calibration method, applied in the direction of analog/digital conversion calibration/test, code conversion, electrical components, etc., to achieve the effect of accurate data and guaranteed operation stability
Active Publication Date: 2018-09-28
北京坤驰科技有限公司
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When the bandwidth of the input signal is greater than fs / 2, the output of the ADC of each channel is aliased. It is reflected in the output spectrum that the input signal greater than fs / 2 is folded back into fs / 2. At this time, the output spectrum information has been It cannot truly reflect the time error information, so it is no longer possible to introduce a delay filter on each channel for error compensation
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[0054] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.
[0055] figure 1 It is a flow chart of the multi-channel time-interleaved ADC measurement and calibration method of the present invention.
[0056] Such as figure 1 As shown, a multi-channel time-interleaved ADC measurement calibration method includes the following steps:
[0057] Step S1, M ADC channels collect calibration signals; wherein M is a positive integer. The calibration signal is sent by the signal sending module, but the calibration signal received by the ADC channel is not equal to the calibration signal sent by the signal sending module due to the existence of DC errors, amplitude errors, and phase errors.
[0058] Step S2, measuring and correcting the DC error of the calibration signal collected by ...
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The invention relates to a multi-channel time-interleaved ADC (Analog to Digital Converter) measurement calibration method and device. The method comprises the following steps: step S1, acquiring calibration signals by M ADC channels, wherein M is a positive integer; step S2, measuring and correcting a direct current error of the calibration signal acquired by each ADC channel to obtain a first calibration signal of each ADC channel; step S3, based on the first calibration signal of each ADC channel, measuring and correcting an amplitude error of each ADC channel to obtain a second calibration signal of each ADC channel; and step S4, based on the second calibration signal of each ADC channel, measuring and correcting a phase error of each ADC channel to obtain a third calibration signal of each ADC channel. Through adoption of the method and the device, the problems of how to quickly and accurately solve the mismatch problem caused by inconsistency of TIADC (Time-interleaved Analog Digital Converter) channels at a numerical part and how to realize fast calibration in an FPGA are solved.
Description
technical field [0001] The invention relates to the field of multi-channel time-interleaved ADCs, in particular to a multi-channel time-interleaved ADC measurement and calibration method and device. Background technique [0002] High-speed and high-precision analog-to-digital converter (Analog Digital Converter, ADC) is a key component of many modern electronic systems such as radar, medical equipment, and communication. Due to the existing device manufacturing technology and the influence of ADC word length, the traditional structure of ADC is limited in breaking through high speed and high precision. In order to obtain a higher sampling speed than a single-chip ADC, a time-interleaved parallel sampling technology was developed, which led to the birth of a time-interleaved analog digital converter (TIADC). TIADC is composed of M parallel independent ADCs (channels). Each ADC alternately samples the input signal at a sampling rate of fs / M. Finally, the sampling output of M ...
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IPC IPC(8): H03M1/10
CPCH03M1/1009
Inventor 熊军王逸白利
Owner 北京坤驰科技有限公司