Double-shaft tilting sample holder for transmission electron microscope

An electron microscope, biaxial tilting technology, applied in the direction of using radiation for material analysis, etc., can solve the problems of tilting error, poor spring stability, inconvenient introduction, etc., to achieve the effect of wide versatility, low cost and convenient processing

Active Publication Date: 2016-07-13
BEIJING UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This double-tilt sample rod can be introduced into the optical fiber and electrode system, but its double-tilt push rod and spring also occupy a large vol

Method used

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  • Double-shaft tilting sample holder for transmission electron microscope
  • Double-shaft tilting sample holder for transmission electron microscope
  • Double-shaft tilting sample holder for transmission electron microscope

Examples

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Example Embodiment

[0022] The present invention is further described below with reference to the accompanying drawings, in which exemplary embodiments of the invention are illustrated.

[0023] The center of the sample rod body 9 is provided with a through hole that is adapted to the size of the drive rod 4 , the linear stepping motor 10 is fixed on the rear end of the sample rod, and the motor leads lead out the sample through the vacuum sealing interface provided at the end of the sample rod body 9 The rod, the driving rod 4 and the linear stepping motor 10 are connected by plugging and unplugging the rubber seal. The front-end tilting table 1 is connected with the front end 2 of the sample rod body through the rigid tilting shaft 8. The lower surface of the front-end tilting table 11 passes through The rotating shaft 7 is connected with the connecting rod 3, the connecting rod 3 is connected with the driving rod 4 through the rigid driving rod fixing shaft 5, and the driving rod fixing shaft 5...

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PUM

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Abstract

The invention discloses a double-shaft tilting sample holder for a transmission electron microscope.The double-shaft tilting sample holder comprises a sample holder body, front-end tilting tables, driving rods, connecting rods, tilting shafts, rotary shafts, driving rod fixing shafts and a sample stage.Shaft holes are reserved in the front-end tilting tables, and the front-end tilting tables are connected with the sample holder body by the rotary shafts.The connecting rods, boss clamp grooves and driving rod clamp grooves are connected with one another by the rotary shafts.Two symmetric through movement guide grooves are formed in two sides of sample holder body front ends, the driving rods are fixed by the aid of the driving rod fixing shafts, and the constrained driving rods can be driven by a linear stepper motor at a holder body rear end to linearly reciprocate, so that the sample stage can rotate around the rotary shafts.The double-shaft tilting sample holder has the advantages that tilting angles of the sample stage can be precisely controlled by the high-precision linear stepper motor; the maximum tilting angles of the sample stage can be adjusted by the aid of included angles between bosses on the lower surfaces of the front-end tilting tables and the lengths of the movement guide grooves; the double-shaft tilting sample holder can be used with the conventional transmission electron microscope and is wide in universality.

Description

technical field [0001] The invention relates to a sample rod with a novel dual-axis tilting mode for a transmission electron microscope. Through the sample rod, the observation of the microstructure of a material can be realized at the atomic lattice resolution. The invention belongs to the field of transmission electron microscope accessories . Background technique [0002] The scientific theory, preparation and processing level of materials have become the restrictive factors of a country's scientific and technological progress. The macroscopic properties of materials depend on their microstructure. Transmission electron microscope (TEM) is an important device for characterizing the microstructure of materials. As one of the important components of TEM, the sample rod plays the role of carrying the sample and applying multi-physical fields such as force, heat, electricity, light, etc. to the sample. At present, the in-depth study of materials science has put forward high...

Claims

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Application Information

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IPC IPC(8): G01N23/04
CPCG01N23/04
Inventor 韩晓东张剑飞毛圣成翟亚迪王晓冬李志鹏栗晓辰张韬楠马东锋张泽
Owner BEIJING UNIV OF TECH
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