Supercharge Your Innovation With Domain-Expert AI Agents!

Curved surface local normal vector measuring method based on vortex dot matrix

A measurement method and technology of normal vectors, applied in the field of detection, can solve problems such as difficulty in accurate measurement of normal vectors

Active Publication Date: 2016-07-27
DALIAN UNIV OF TECH
View PDF4 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem mainly solved by the invention is to overcome the deficiencies of the existing methods. Aiming at the problem that it is difficult to accurately measure the normal vector of the curved surface of aluminum alloy precision parts during processing, a method for measuring the local normal vector of the curved surface based on the eddy current lattice is invented. Three eddy current displacement sensors are used in the eddy current array, which has the advantages of non-contact measurement and no reflection interference; the influence of mutual coupling interference between multiple sensors in the eddy current array is suppressed, and the accuracy of normal vector measurement is improved.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Curved surface local normal vector measuring method based on vortex dot matrix
  • Curved surface local normal vector measuring method based on vortex dot matrix
  • Curved surface local normal vector measuring method based on vortex dot matrix

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The specific implementation manner of the present invention will be described in detail in conjunction with the accompanying drawings and technical solutions.

[0036] attached figure 1 -Schematic diagram of surface method vector measurement based on eddy current lattice, the tested part 13 is a cylindrical aluminum alloy part, its section arc angle is 40°, arc radius is 1m, reference busbar is 500mm, and wall thickness is 6mm. The measurement face is the outer surface of the part. The basic parameters of the three eddy current sensors are: measuring range 10mm, coil diameter 20mm, linearity 0.3%, resolution 1μm. In order to facilitate the measurement motion planning, the section trajectory is along the direction of the generatrix of the cylindrical surface, the scanning measurement method is bidirectional reciprocating measurement, and the scanning measurement speed is 200mm / min.

[0037] The first step is the assembly of the eddy current lattice measurement device. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of detection, and relates to a curved surface local normal vector measuring device and method based on a vortex dot matrix.In the measuring method, a three-point method is adopted to conduct normal vector measurement on a local curved surface, and a normal vector of a tiny plane is formed by three measuring points at an envelope machining position and used for approximately replacing a normal vector of a machining point.A calibration plate is driven by a bi-directional rotating table to rotate, and relative position calibration under a machine tool coordinate system is completed by sensors according to output changes of all the sensors in the vortex dot matrix.The vortex probe dot matrix is driven by the numerical control machine tool to scan and measure a measured part according to a measuring path planned in advance, and accurate curved surface local normal vector measuring is completed through tilt angle error compensation and normal vector calculation data processing.The curved surface local normal vector measuring device is suitable for scanning and measuring the curved surface local normal vector of the precise metal part in an on-machine mode and is compact in structure, the measuring method is accurate, easy to operate, reliable and high in measuring efficiency.

Description

technical field [0001] The invention belongs to the technical field of detection, and in particular relates to a device and method for measuring a local normal vector of a curved surface based on an eddy current lattice. Background technique [0002] Surface normal vector measurement is the key technology in the aircraft skin mirror image processing system and aircraft panel automatic drilling processing system. The measurement accuracy of the normal vector directly affects the remaining wall thickness of the skin and the verticality and diameter parameters of the hole. These parameters are the key parameters that affect the processing quality. To solve the above problems, the attitude of the actuator can be adjusted according to the measurement feedback by installing a normal vector measuring device on the end effector. At present, the surface normal vector measurement often adopts optical measurement methods, using multiple laser sensor arrays or multiple laser beam proje...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B21/02
CPCG01B21/02
Inventor 王永青廉盟刘海波张军贾振元盛贤君薄其乐李阳应扬威
Owner DALIAN UNIV OF TECH
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More