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Frequency tester and frequency test system

A frequency tester and frequency technology, applied in the field of electronics, can solve the problems of multiplying the cost of the test card board, and achieve the effect of improving the test efficiency and reliability

Inactive Publication Date: 2016-07-27
CRM ICBG (WUXI) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] If you want to rely on TMU to realize the true multi-die simultaneous test, you need to increase the number of TMUs on the test card board, but the cost of the test card board will increase exponentially

Method used

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Experimental program
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specific Embodiment

[0040] Suppose, the frequency target value to be measured is 4M, the frequency upper limit is 5.2M, and the measurement accuracy is required to be 1%.

[0041] From the given situation, it is easy to know that f=4M, fmax=5.2M, X=1%, described by the above principle, it is easy to draw:

[0042] A≥1 / X=100, Amax≥130, considering the minimum design, take A=100, Amax=130, because 2 N ≥Amax, so N≥8, N-bit counter enabling time T=A / f=25us, that is, to reach the test target frequency of 4M, frequency upper limit of 5.2M, and measurement accuracy of 1% test requirements, only one frequency test module needs to be designed An 8-bit counter can meet the frequency measurement requirements, and the single frequency test time is 25us.

[0043] see image 3 Shown is a schematic structural diagram of the frequency comparison module of the present invention, the frequency comparison module includes a frequency upper limit unit, a frequency lower limit unit and a frequency detection result g...

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Abstract

The invention relates to a frequency tester. The frequency tester comprises a reference clock generation module, a signal comparison module and a result output module. The invention further relates to a frequency test system. The frequency test system comprises the to-be-tested equipment and the frequency tester, wherein the to-be-tested equipment comprises a to-be-tested frequency generator, a frequency test module and a frequency comparison module, an enablement end of the frequency test module is connected with an output end of the reference clock generation module, an input end of the frequency test module is connected with an output end of the to-be-tested frequency generator, an output end of the frequency test module is connected with an input end of the frequency comparison module, and an output end of the frequency comparison module is connected with an input end of the signal comparison module. Through the frequency tester and the frequency test system, the frequency test module and the frequency comparison module are arranged in the to-be-tested equipment, frequency comparison is realized completely through the hardware, the structures are simple, test efficiency and reliability are improved, and the application scope is wide.

Description

technical field [0001] The present invention relates to the field of electronic technology, in particular to integrated circuits, and in particular to a frequency tester and a frequency test system. Background technique [0002] Frequency testing in integrated circuit testing is a common test item. At present, integrated circuit frequency testing relies on the frequency test module in the tester to collect the frequency, and then the tester judges whether the collected frequency meets the test specifications through software, that is, the current integrated circuit During the frequency test, the tester needs to do two things: frequency collection and frequency judgment. General frequency test items rely on the frequency test module (TMU) of the tester to achieve frequency test. When testing multiple dies at the same time, one TMU is only responsible for frequency acquisition of one die at the same time. For example, there is only one TMU on the test card board. , when multi...

Claims

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Application Information

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IPC IPC(8): G01R23/10
Inventor 谢兴华
Owner CRM ICBG (WUXI) CO LTD