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A three-way force measuring device for scratch test instrument

A scratch test and measuring device technology, applied in measuring devices, force/torque/work measuring instruments, instruments, etc., can solve the problems of cost increase, inability to obtain effective real-time test data, and high cost of three-way force sensors. The effect of easy sensor replacement

Active Publication Date: 2018-12-25
SOUTHWEST JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, most of the scratch test instruments on the market have a relatively simple structure, and most of their functions are only to complete a simple single scratch test. During the test, different loads can only be completed by loading a constant weight on the scratch head. / Scratch test at different depths
However, after the test is completed, we can only rely on microscopic observation methods to judge the scratch resistance of the surface of the material, such as the shape, width, and depth, and cannot obtain the real-time normal force or tangential force during the scratch process. Data, and for a single complex form (circle, square) scratch, it is impossible to obtain effective real-time test data during the scratch test
For some expensive scratch test instruments, although the data in the scratch test process can be measured in real time, the scope of application of the measurement system is limited, most of them can only measure the force in the two-axis direction, and cannot complete the single complex scratch Real-time data measurement in the form of traces; and the high price makes the cost significantly increased
[0003] In addition, the three-way force sensor is expensive to use alone, and limited by its own structure, the range and accuracy in each direction have certain limitations
Moreover, the measurement range and parameters of each axis cannot be changed during use, which limits its use range

Method used

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  • A three-way force measuring device for scratch test instrument
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  • A three-way force measuring device for scratch test instrument

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Embodiment Construction

[0016] Below in conjunction with accompanying drawing, the structure of the present invention is described in further detail.

[0017] figure 1 Through the three-dimensional view of the overall assembly, the assembly relationship diagram of each component is given. First install the miniature load cell 2 into the sensor connection block 1; then install the Z-axis miniature tension and pressure sensor 3 to the sensor connection block 1 through the threaded hole 7; install the X-axis miniature tension and pressure sensor 5 through the threaded hole 8 to the sensor connection Block 1; finally, connect the Z-axis connecting rod 4 with the thread of the Z-axis micro tension-compression sensor 3;

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Abstract

The invention discloses a three-way force measuring device for a scratch test instrument. A miniature weighing sensor (2) is installed in a sensor connection block (1). The Z-axis miniature tension-compression sensor (3) is installed to the sensor connection block (1) through the threaded hole (7), and the X-axis miniature tension-compression sensor (5) is installed to the sensor connection block (1) through the threaded hole (8). Connect the Z-axis connecting rod (4) through the thread of the Z-axis miniature tension-pressure sensor (3). Connect the Z-axis connecting rod (4) to the balance pull rod (6) through the thread of the X-axis miniature tension and pressure sensor (5). The invention provides a three-way force measuring device for a scratch test instrument, which has the advantages of being able to measure forces in three directions (X axis, Z axis and Y axis) at the same time, easy to replace sensors, economical and practical, and the like.

Description

technical field [0001] The invention relates to a measuring device, in particular to a three-way force measuring device used for a scratch test instrument. Background technique [0002] At present, most of the scratch test instruments on the market have a relatively simple structure, and most of their functions are only to complete a simple single scratch test. During the test, different loads can only be completed by loading a constant weight on the scratch head. / Scratch test at different depths. However, after the test is completed, we can only rely on microscopic observation methods to judge the scratch resistance of the surface of the material, such as the shape, width, and depth, and cannot obtain the real-time normal force or tangential force during the scratch process. Data, and for a single complex form (circle, square) scratch, it is impossible to obtain effective real-time test data during the scratch test process. For some expensive scratch test instruments, a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N3/02G01L5/00
CPCG01L5/0028G01N3/02
Inventor 程前魏耀富杨卓然蒋晗
Owner SOUTHWEST JIAOTONG UNIV