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Modularized multi-port scattering parameter testing apparatus and method

A scattering parameter test, multi-port technology, applied in the field of testing, can solve the problems of inability to test the actual flexible expansion, reduce the test efficiency, increase the cost of the instrument, etc., to improve the test efficiency, improve the flexibility, and reduce the time of hardware design.

Inactive Publication Date: 2016-08-10
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the number of ports in the existing solution is fixed, and it cannot be flexibly expanded according to the actual test. The cost of the instrument will increase significantly for different test needs.
[0008] (2) A multi-port vector network analyzer in the form of a multi-receiver, although the test speed is faster than that using a switch matrix, the price is very high cost and complex structure
[0009] (3) In the existing scheme, the multi-port scattering parameter test device only plays the role of signal switching, and the pressure of high-speed multi-channel data processing is all on the side of the vector network analyzer, which will undoubtedly reduce the test efficiency

Method used

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  • Modularized multi-port scattering parameter testing apparatus and method

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Embodiment 1

[0053] The present invention aims to provide a modular multi-port scattering parameter testing device. The test signal is generated by the source of the vector network analyzer, connected to the multi-port scattering parameter testing device through the port and cable of the vector network analyzer, and then passed through the module The optimized switch matrix is ​​switched to each test port. The reference signal and the test signal are respectively input to a digital signal processing unit (Digital Signal Processing Unit, DSP) through a switch for frequency mixing, filtering and digital processing. Such as figure 1 The schematic block diagram of the modularized multi-port scattering parameter testing device is mainly composed of three basic modules: a signal separation module 1, a switch matrix 2 and a digital signal processing unit 3, wherein the hardware schematic diagram of the digital signal processing unit 3 is as follows Figure 6 As shown, it includes a mixer, an int...

Embodiment 2

[0056] On the basis of the above embodiments, the present invention proposes a modular multi-port scattering parameter testing method, which is carried out according to the following steps:

[0057] Step 1: The port of the vector network analyzer is connected to the modular multi-port scattering parameter test device through a cable, and the output signal of the vector network analyzer enters the signal separation module of the device, and the signal separation module separates the reference signal and the test signal, among which The reference signal enters the digital signal processing unit for basic processing such as down-conversion and filtering, while the test signal enters the switch matrix;

[0058] Step 2: The test signal enters different paths through the switching control of the switch in the switch matrix, and is transmitted to the device under test through the test port; the switch matrix in the present invention adopts a modular design, which can easily form a var...

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Abstract

The invention discloses a modularized multi-port scattering parameter testing device and method, belonging to the technical field of testing, comprising a plurality of signal separation modules, a switch matrix module, a digital signal processing unit, and a plurality of test ports. The signal separation module and digital The signal processing unit is connected through a line, and the signal separation module, the switch matrix module and the test port are connected through a line in sequence. The present invention can quickly form various types of multi-port scattering parameter test devices through the basic switch matrix module, which improves the flexibility of design, reduces the cost, reduces the time of hardware design, and reduces the time for multi-port scattering parameter testing. The data processing pressure of the vector network analyzer improves the test efficiency.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a modular multi-port scattering parameter testing device and method. Background technique [0002] In recent years, in addition to radar, communication and other fields, in satellite navigation, radio and television, microwave relay and other microwave applications, many multi-port components and components have been widely used, such as mixers, duplexers, couplers , isolator and circulator, etc., when characterizing the scattering parameters of such devices, a multi-port scattering parameter testing device will be used. [0003] Because many microwave devices used in wireless communication and radar have four or more ports, if a two-port vector network analyzer is used to test these devices, multiple connections are required to complete the characterization of scattering parameters. In scientific research and production, it is necessary to complete rapid testing whi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/16H04B17/29
CPCH04B17/16H04B17/29
Inventor 袁国平杨明飞刘丹庄志远梁胜利李明太
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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