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Cuvette and its optical system for measuring scattering spectrum

A cuvette and spectrum technology, applied in the field of cuvettes and their optical systems, can solve the problems of low light utilization, difficulty in avoiding excitation light, entering photoelectric detectors, etc., and achieves wide application range, simple structure, and easy promotion Applied effect

Inactive Publication Date: 2019-03-29
GUANGXI UNIVERSITY OF TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is to provide a cuvette for measuring the scattering spectrum and its optical system, so as to solve the shortcomings of the prior art that it is difficult to prevent the excitation light from entering the photodetector and the light utilization rate is low

Method used

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  • Cuvette and its optical system for measuring scattering spectrum
  • Cuvette and its optical system for measuring scattering spectrum
  • Cuvette and its optical system for measuring scattering spectrum

Examples

Experimental program
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Embodiment 1

[0029] A kind of cuvette 1 for measuring the scattering spectrum, comprising cuvette body 11, the longitudinal section of the cuvette body 11 is a right-angled trapezoidal structure with oblique waist and curved concave surface 111, the incident angle of the cuvette body 11 is θ is 60°, so that the incident light can be totally reflected in the sample with a refractive index greater than 1.16, and the incident angle θ is the angle between the incident light and the normal line of the curved concave surface 111 . The arcuate concave surface 111 intersects the vertical line h of the cuvette body 11 at the position of H1:H2=3:7 in the vertical direction, and H1 is the upper bottom surface of the cuvette body to the arcuate concave surface and the colorimetric The vertical distance of the intersection point of the vertical line h in the cuvette body; H2 is the vertical distance from the lower bottom surface of the cuvette body to the intersection point of the curved concave surface...

Embodiment 2

[0032] An optical system for measuring the scattering spectrum, comprising an excitation light source 2, a slit I3, a cuvette, and a photodetector 4 sequentially arranged on the optical path, and the cuvette is the one described in Embodiment 1 for Measure the cuvette 1 of scattering spectrum, the concrete structure of this cuvette is as follows:

[0033] A kind of cuvette 1 for measuring the scattering spectrum, comprising cuvette body 11, the longitudinal section of the cuvette body 11 is a right-angled trapezoidal structure with oblique waist and curved concave surface 111, the incident angle of the cuvette body 11 is θ is 60°, so that the incident light can be totally reflected in the sample with a refractive index greater than 1.16, and the incident angle θ is the angle between the incident light and the normal line of the curved concave surface 111 . The arcuate concave surface 111 intersects the vertical line h of the cuvette body 11 at the position of H1:H2=3:7 in the ...

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Abstract

A cuvette for measuring scattering spectrum and its optical system, relates to a cuvette and its optical system, wherein the cuvette includes a cuvette body, the longitudinal section of the cuvette body is an oblique waist and an arc The right-angled trapezoidal structure of the concave surface, all sides of the cuvette body are light-transmitting, and the incident angle θ is greater than 56°, the arc-shaped concave surface intersects the vertical line h of the cuvette body at a position of 3:7 along the vertical direction . The optical system includes an excitation light source, slit I, the above-mentioned cuvette, and a photoelectric detector. The excitation light source and slit I are arranged on the plane side of the cuvette body, and the photodetector is arranged at the focal point of the curved concave surface. The invention uses the principle of total reflection to expand the interval between the excitation light and the scattered light, preventing the excitation light from entering the detector; at the same time, collecting the scattered light through the arc-shaped concave surface improves the luminous flux and light utilization rate entering the detector, and can be used in Measurement of scattered light generated by excitation of fluorescence, phosphorescence or Raman light of liquid samples.

Description

technical field [0001] The invention relates to a cuvette and its optical system, in particular to a cuvette for measuring scattering spectrum and its optical system. Background technique [0002] Spectral measurements can take the form of transmission, reflection, diffusion, etc., as well as scattered light generated by optical excitation such as fluorescence and Raman light. The intensity of scattered light relative to excitation light is several orders of magnitude lower for fluorescence and even lower for Raman light. Therefore, when measuring the scattering spectrum, it is necessary to increase the intensity of the excited light as much as possible, and at the same time avoid the excitation light from entering the detector as much as possible. In order to avoid the influence of the excitation light, the incident light path and the detection light path are vertical at present, and the excited scattered light is detected from the direction least affected by the excitatio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/01G01N21/64G01N21/65
CPCG01N21/01G01N21/64G01N21/65G01N2021/0112
Inventor 粟晖姚志湘
Owner GUANGXI UNIVERSITY OF TECHNOLOGY