Optimal three-dimensional morphology measurement method

A technology of three-dimensional topography and measurement method, applied in the field of three-dimensional measurement, can solve problems such as complex three-dimensional solution process, and achieve the effect of simple calibration process, less sources of measurement errors, and fewer calibration parameters.

Active Publication Date: 2016-09-21
XI AN JIAOTONG UNIV
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Problems solved by technology

The existing sinusoidal fringe projection three-dimensional measurement profilometry has the following characteristics: the phase of the projected sinusoidal fringe pattern changes linearly along a certain direction in the entire image plane; in the measurement system composed of a single camera and a single projector, the phase to The transformation of the three-dimensional shape of the measured object always uses the triangular relationship between the projection light and the camera sampling light. In many cases, a reference surface is required, and the three-dimensional solution process is complicated.

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Embodiment Construction

[0038] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0039] An optical three-dimensional shape measurement method, comprising the following steps:

[0040] Step 1: According to the actual measurement requirements, arrange a measurement system consisting of a projection system and a camera equipped with a telecentric lens, refer to figure 1 , the optical axis of the projection system and the optical axis of the camera in the measurement system are equivalently collinear through the design of the optical path. In actual use, the optical axis of the projection system and the optical axis of the camera do not have to be collinear. The measurement principle is as follows figure 2 As shown, where ON is the optical axis of the projection system, point B is the intersection point between the optical axis of the projection system and the projection pixel array, and the light emitted from the light source O is p...

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Abstract

Disclosed is an optimal three-dimensional morphology measurement method. First of all, according to actual measurement requirements, a measurement system composed of a projection system and a camera is well arranged; then according to measurement needs, a fringe pattern is designed and is projected to the surface of a measured object by the projection system, and the fringe pattern reflected by the object is sampled by the camera; then a wrapping phase is demodulated from the sampled fringe pattern, and a real phase value of the fringe pattern is obtained after unwrapping; then X-axis and Y-axis coordinates of the measured object are obtained through magnifying power of a telecentric lens, the pixel size of the camera and image coordinates of the sampled fringe pattern; and finally, correlation parameters of the projection system are obtained through calibration, and through combination with a fringe phase, according to a triangular relation, Z-axis coordinates of the measured object are solved. The calibration process is simple, the solving speed of three-dimensional coordinates is improved and higher measurement precision can be realized; and application of all subsequent measurement can be ensured through calibration once, and the efficiency is quite high.

Description

technical field [0001] The invention belongs to the technical field of three-dimensional measurement, and in particular relates to an optical three-dimensional shape measurement method. Background technique [0002] Three-dimensional measurement has a wide range of requirements in rapid prototyping and quality inspection. At the same time, it is also widely used in reverse engineering, medical and other fields. The traditional three-dimensional measurement method is mainly contact measurement, such as three-coordinate measuring machine. With the advancement of optical technology, optical three-dimensional measurement technology has been greatly developed, and is more and more widely used in three-dimensional measurement. Typical optical three-dimensional measurement methods include laser scanning measurement, line laser scanning measurement, structured light projection measurement and interferometry. Among them, the structured light projection three-dimensional measuremen...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 赵宏张春伟
Owner XI AN JIAOTONG UNIV
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