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Laser device linewidth measuring instrument based on arm9 embedded platform

An embedded, measuring instrument technology, applied in geometric characteristics/aberration measurement, testing optical performance, etc., can solve problems such as inconvenience and complex line width measurement system, avoid data processing, facilitate experimental process, and simplify experimental operation. Effect

Inactive Publication Date: 2016-09-21
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Usually, the test of laser line width requires an additional computer for final data acquisition and data processing, so the line width measurement system is more complicated and not convenient enough

Method used

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  • Laser device linewidth measuring instrument based on arm9 embedded platform
  • Laser device linewidth measuring instrument based on arm9 embedded platform

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Experimental program
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Embodiment Construction

[0025] see figure 1 As shown, the present invention provides a line width measuring instrument based on the arm9 embedded platform, comprising:

[0026] A first optical fiber coupler 12, the first optical fiber coupler 12 adopts a 1×2 3dB coupler, which is used to divide the signal light into two bundles, and respectively couple into the optical fiber delay line 13 and the acousto-optic modulator 14;

[0027] -An optical fiber delay line 13, the input end of which is connected to the first output end of the optical fiber coupler 12, the delay fiber length of the optical fiber delay line 13 is 25Km, and the signal light passes through the delay effect of the optical fiber delay line 13 , enter the first input end of the second fiber coupler 15;

[0028] The input end of the acousto-optic modulator 14 is connected to the second output end of the optical fiber coupler 12. The frequency shift amount of the acousto-optic modulator 14 is 110 MHz. The signal light enters the the se...

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PUM

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Abstract

The invention discloses a laser device linewidth measuring instrument based on an arm9 embedded platform. The laser device linewidth measuring instrument comprises a first optical fiber coupler, an optical fiber delay line, an acoustic-optical modulator, a second optical fiber coupler, a photoelectric detector, a spectrum analysis module and the embedded platform, wherein an input end of the optical fiber delay line is connected with a first output end of the first optical fiber coupler; an input end of the acoustic-optical modulator is connected with a second output end of the first optical fiber coupler; a first input end of the second optical fiber coupler is connected with an output end of the optical fiber delay line, and a second input end is connected with an output end of the acoustic-optical modulator; an input end of the photoelectric detector is connected with an output end of the second optical fiber coupler; an input end of the spectrum analysis module is connected with an output end of the photoelectric detector; and an input end of the embedded platform is connected with an output end of the spectrum analysis module, and the embedded platform is used for carrying out data analysis on the spectrum analysis module. The laser device linewidth measuring instrument has the advantages of convenient operation, portability and the like, and can be used for measuring linewidth of a narrow linewidth laser device.

Description

technical field [0001] The invention relates to the field of semiconductor laser testing, in particular to a semiconductor laser line width measuring instrument, in particular to a laser line width measuring instrument based on an arm9 embedded platform. Background technique [0002] Since the 1970s, after semiconductor lasers achieved room temperature and continuous lasing, a new period of development of semiconductor lasers has opened up, enabling optical information represented by optical fiber communication, optical fiber sensing, optical information storage, optical information processing and display, etc. Technology is booming and has become increasingly widely used. At present, semiconductor lasers have become an indispensable and important light source in applications such as optical fiber communication, optical storage, optical interconnection, laser molecular spectroscopy, and optical measurement. Compared with other types of lasers, semiconductor lasers have outs...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/0242
Inventor 苏亚嫚祝宁华刘建国于丽娟
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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