Laser device linewidth measuring instrument based on arm9 embedded platform

An embedded, measuring instrument technology, applied in geometric characteristics/aberration measurement, testing optical performance, etc., can solve problems such as inconvenience and complex line width measurement system, avoid data processing, facilitate experimental process, and simplify experimental operation. Effect

Inactive Publication Date: 2016-09-21
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

[0005] Usually, the test of laser line width requires an additional computer for final data acquisition and data processing, so the line width measurement system is more complicated and not convenient enough

Method used

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  • Laser device linewidth measuring instrument based on arm9 embedded platform
  • Laser device linewidth measuring instrument based on arm9 embedded platform

Examples

Experimental program
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Effect test

Embodiment Construction

[0025] see figure 1 As shown, the present invention provides a line width measuring instrument based on the arm9 embedded platform, comprising:

[0026] A first optical fiber coupler 12, the first optical fiber coupler 12 adopts a 1×2 3dB coupler, which is used to divide the signal light into two bundles, and respectively couple into the optical fiber delay line 13 and the acousto-optic modulator 14;

[0027] -An optical fiber delay line 13, the input end of which is connected to the first output end of the optical fiber coupler 12, the delay fiber length of the optical fiber delay line 13 is 25Km, and the signal light passes through the delay effect of the optical fiber delay line 13 , enter the first input end of the second fiber coupler 15;

[0028] The input end of the acousto-optic modulator 14 is connected to the second output end of the optical fiber coupler 12. The frequency shift amount of the acousto-optic modulator 14 is 110 MHz. The signal light enters the the se...

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Abstract

A line width measuring instrument based on an arm9 embedded platform, comprising: a first optical fiber coupler; an optical fiber delay line, whose input end is connected to the first output end of the optical fiber coupler; an acoustic light modulator, whose input end It is connected with the second output end of the optical fiber coupler; a second optical fiber coupler, its first input end is connected with the output end of the fiber delay line, and its second input end is connected with the output end of the acousto-optic modulator; a photoelectric detector, its input end is connected with the output end of the fiber coupler; a spectrum analysis module, its input end is connected with the output end of the photodetector; an embedded platform, its input end is connected with the output end of the spectrum analysis module, with It is used for data analysis of the spectrum analysis module. The invention has the characteristics of convenient operation, portable equipment and the like, and can measure the line width of a narrow line width laser.

Description

technical field [0001] The invention relates to the field of semiconductor laser testing, in particular to a semiconductor laser line width measuring instrument, in particular to a laser line width measuring instrument based on an arm9 embedded platform. Background technique [0002] Since the 1970s, after semiconductor lasers achieved room temperature and continuous lasing, a new period of development of semiconductor lasers has opened up, enabling optical information represented by optical fiber communication, optical fiber sensing, optical information storage, optical information processing and display, etc. Technology is booming and has become increasingly widely used. At present, semiconductor lasers have become an indispensable and important light source in applications such as optical fiber communication, optical storage, optical interconnection, laser molecular spectroscopy, and optical measurement. Compared with other types of lasers, semiconductor lasers have outs...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/0242
Inventor 苏亚嫚祝宁华刘建国于丽娟
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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