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Method for detecting cobalt removal depth of polycrystalline diamond compact

A technology of polycrystalline diamond and composite sheet, which is applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of high cost, weak reference value, limited convincing power, etc., and achieve the effect of reducing the cost of detection

Active Publication Date: 2016-09-28
HENAN JINGRUI SUPERHARD MATERIAL
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Problems solved by technology

At present, there are two general methods for measuring the depth of cobalt removal: one is to use a high-power optical microscope or a derivative measurement device, which can achieve a rough measurement of the depth of cobalt removal, but the reference value is not strong and the convincing power is limited; the other is to use a scanning electron microscope. , can effectively achieve accurate measurement of products with different cobalt removal depths in different positions, but the non-conductive parts need to be sprayed with gold during the sample preparation process, the cost is high, and the process is cumbersome and complicated

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  • Method for detecting cobalt removal depth of polycrystalline diamond compact

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Embodiment Construction

[0033] The core idea of ​​the present invention is to provide a method for detecting the cobalt removal depth of a polycrystalline diamond compact, which can use a simplified process to prepare samples, and can greatly reduce the detection cost.

[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0035] The first method for detecting the cobalt removal depth of polycrystalline diamond compacts provided in the embodiments of the present application is as follows: figure 1 as shown, figure 1 It is a flowchart ...

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Abstract

The invention discloses a method for detecting cobalt removal depth of a polycrystalline diamond compact. The method comprises the following steps: pretreatment is carried out for the polycrystalline diamond compact with cobalt removed; the polycrystalline diamond compact is cut at a diameter direction along a cross section; further processing is carried out for a section of the polycrystalline diamond compact; scanning and screenshot are carried out for the section, and the cobalt removal depth is marked. The method for detecting cobalt removal depth of the polycrystalline diamond compact has a simplified flow for preparing a sample, so that detection cost is substantially reduced.

Description

technical field [0001] The invention belongs to the technical field of superhard tool manufacturing, in particular to a method for detecting the cobalt removal depth of a polycrystalline diamond composite sheet. Background technique [0002] With the wide application of diamond compacts in the fields of oil and natural gas extraction and the continuous improvement of oil and gas extraction technology, the demand for high wear-resistant diamond compacts is also increasing. The cobalt removal operation on the diamond composite sheet can effectively improve the heat resistance of the product, thereby greatly improving the wear resistance of the diamond composite sheet product. [0003] At present, the methods used to remove cobalt from polycrystalline diamond compacts mainly include electrolysis and acid leaching. Although the principles are different, they can effectively remove part of the cobalt in the diamond layer and effectively improve the heat resistance of diamond comp...

Claims

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Application Information

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IPC IPC(8): G01N33/00
CPCG01N33/00
Inventor 柳航
Owner HENAN JINGRUI SUPERHARD MATERIAL
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