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Method for eliminating residual magnetic field in objective lens of transmission electron microscope

A technology of transmission electron microscopy and residual magnetic field, applied in circuits, discharge tubes, electrical components, etc., to achieve the effect of expanding academic research, low cost, and simple operation

Inactive Publication Date: 2016-10-12
FUDAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, for the participating magnetic field existing in the TEM objective lens, this method is no longer applicable

Method used

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  • Method for eliminating residual magnetic field in objective lens of transmission electron microscope
  • Method for eliminating residual magnetic field in objective lens of transmission electron microscope
  • Method for eliminating residual magnetic field in objective lens of transmission electron microscope

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Embodiment Construction

[0021] Below in conjunction with accompanying drawing and specific embodiment, further illustrate the present invention, should be understood that these embodiments are only for illustrating the present invention and are not intended to limit the scope of the present invention, after having read the present invention, those skilled in the art will understand various aspects of the present invention Modifications in equivalent forms all fall within the scope defined by the appended claims of this application.

[0022] figure 1 It reflects the relationship between the magnetic field strength and time in the degausser. The magnetic field in the objective lens of the transmission electron microscope is realized by passing current through the objective lens coil, while the AC degausser mainly uses a hollow solenoid. When the coil of the solenoid passes through the current, a magnetic field will be generated to achieve degaussing. This design can be used to achieve AC degaussing, ...

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Abstract

The invention belongs to the technical field of transmission electron microscopes, and particularly discloses a method for eliminating a residual magnetic field in an objective lens of the transmission electron microscope. The residual magnetic field in the objective lens of the transmission electron microscope is eliminated by an AC demagnetization method. In order to provide a stable and strong external magnetic field and to ensure the demagnetization validity, a coil demagnetizer is designed; an objective lens coil is transformed; the direction of the magnetic field generated by the demagnetizer alternately changes at a certain frequency (about 0.35Hz) by controlling the strength and the frequency of introduced current; the magnetic field intensity periodically changes along with the magnetic field direction, and is reduced to near zero from about 400 Oe; and the residual magnetic field in the objective lens of the transmission electron microscope is effectively eliminated.

Description

technical field [0001] The invention belongs to the technical field of transmission electron microscopy, in particular to a method for eliminating the residual magnetic field of an objective lens of a transmission electron microscope. Background technique [0002] Since the first transmission electron microscope (TEM for short) came out in the 1930s, transmission electron microscopy has become an important tool for characterizing nanomaterials. Especially in the past two decades, transmission electron microscopy technology has made great progress in the fields of spatial distribution rate, energy distribution rate, and time distribution rate represented by spherical aberration correction technology. Scientific and technological progress in the fields of biology and informatics has made great contributions. [0003] In many academic studies on magnetic materials and magnetic domain structures using TEM, it is necessary to determine the initial state of the magnetic structure...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/143
CPCH01J37/143
Inventor 车仁超张捷王超
Owner FUDAN UNIV