System and method for adjusting reference current of sense circuit and sense circuit

A reference current and readout circuit technology, which is applied in the field of memory, can solve problems such as data detection failure and read data misjudgment, and achieve the effects of improving accuracy, simple method, and reducing the probability of data detection failure

Active Publication Date: 2016-11-30
SHANGHAI ADVANCED RES INST CHINESE ACADEMY OF SCI
View PDF8 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the actual high voltage generated by the high voltage generating circuit may not reach the ideal high voltage value due to process deviation and other reasons, but is much lower than the ideal value. At this time, the conduction

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System and method for adjusting reference current of sense circuit and sense circuit
  • System and method for adjusting reference current of sense circuit and sense circuit
  • System and method for adjusting reference current of sense circuit and sense circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0051] see figure 1 , the present invention provides a system 1 for adjusting the reference current of the readout circuit, which is used to adjust the reference current of the readout circuit according to the different high voltages generated by the high voltage generating circuit 2, wherein the readout circuit is used to read the For data, the high-voltage generating circuit can adopt an on-chip high-voltage generating circuit or an...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a system and method for adjusting the reference current of a sense circuit and a sense circuit. The system at least comprises: a high-voltage detection module for detecting a high-voltage signal actually generated by a high-voltage generation circuit, when a target storage unit is subjected to an erasing operation or a write operation, and transferring the detected high-voltage signal into a corresponding control signal when the erasing operation or the write operation is over; a latch module used for latching the control signal generated by the high-voltage detection module and releasing the latched control signal when the target storage unit is subjected to a fetch operation; and a reference current adjustable module used for controlling and generating a corresponding reference current according to the control signal released by the latch module. According to the actual high voltage generated from the high-voltage generation circuit, the reference current of the sense circuit is adjusted, thereby preventing the situation that the break-over current of a floating-gate transistor with electron injection is larger than the reference current.

Description

technical field [0001] The invention relates to the field of memory technology, in particular to a system and method for adjusting the reference current of a readout circuit and a readout circuit. Background technique [0002] EEPROM (Electrically Erasable Programmable Read-Only Memory, Electrically Erasable Programmable Read-Only Memory) is a memory chip that does not lose data after power failure. It can erase existing information on a computer or a special device, reprogram or rewrite). EEPROM is a special form of flash memory that is plug-and-play and can be modified without removing it from the computer. In an EEPROM, it can be reprogrammed frequently while the computer is in use. EEPROM is usually erased and reprogrammed using higher than normal voltages in personal computers, and is a type of read-only memory that can be changed by the user. [0003] The target storage unit of EEPROM adopts a floating gate transistor with a floating gate structure, which stores dat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G11C16/26
Inventor 魏哨静张钊锋梅年松
Owner SHANGHAI ADVANCED RES INST CHINESE ACADEMY OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products