Fault diagnosis method of photovoltaic diode clamping type three-level inverter

A technology of three-level inverters and photovoltaic diodes, applied in the direction of measuring electrical variables, instruments, and measuring electricity, can solve problems affecting the safety of other circuits, difficulty in handling faults, and economic losses in accidents, and achieve fault diagnosis and extraction Convenience, overcome the effect of large amount of data

Inactive Publication Date: 2017-01-04
JIANGNAN UNIV
View PDF7 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among inverters with different structures, multi-level inverters have received widespread attention due to their advantages such as series voltage equalization of power devices, small switching losses, low output voltage harmonic content, and high work efficiency. Because of the use of a large number of switching devices, the reliability of its circuit is relatively low
The failure of any device may lead to abnormal operation of the circuit, and sometimes even affect the safety of other circuits, causing serious accidents or immeasurable economic losses
[0003] Due to the variety of types and reasons for the failure of power electronic equipment, and the real-time requirements of the system, it is often difficult to deal with the failure by traditional manual detection and maintenance. Therefore, a more intelligent method is needed to diagnose the failure of the equipment.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fault diagnosis method of photovoltaic diode clamping type three-level inverter
  • Fault diagnosis method of photovoltaic diode clamping type three-level inverter
  • Fault diagnosis method of photovoltaic diode clamping type three-level inverter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The present invention will be further described below in conjunction with the accompanying drawings.

[0029] The fault diagnosis process of a photovoltaic diode clamped three-level inverter of the present invention is as follows: figure 1 Shown, the concrete implementation of the inventive method comprises the following steps:

[0030] Such as figure 2 The main circuit topology diagram of the diode-clamped three-level inverter is shown. According to the inverter principle, the faults are divided into five categories and thirteen sub-categories, and the faults of the diode-clamped three-level inverter are obtained. Types of.

[0031] 1) Therefore, the IGBT power tubes are operating normally, and the inverter has no faults.

[0032] 2) Only a single IGBT power tube fails, and there are four subcategories.

[0033] 3) There are two IGBT power tubes failing, and the two power tubes are in the same bridge arm, a total of six sub-categories.

[0034] 4) If two IGBT pow...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a fault diagnosis method of a photovoltaic diode clamping type three-level inverter. The fault diagnosis method of the photovoltaic inverter combining with a wavelet multi-scale decomposition method and a support vector machine classification algorithm is provided by aiming at a three-level inverter fault diagnosis problem of a photovoltaic micro-grid, taking a system inversion state as an example, and analyzing fault types of various power tubes. The fault diagnosis method adopts the bridge arm voltage signal of the diode clamping type three-level inverter as a research object, and various frequency band energies are extracted as fault characteristic samples by using the wavelet analysis multi-scale decomposition method, and in addition, a multiple valued support vector machine fault classification model is established, and finally, the open circuit fault diagnosis of the three-level inverter power device is completed. The fault diagnosis method is advantageous in that the various fault states of the diode clamping type three-level inverter are obviously discriminated, and the extraction is convenient, and in addition, problems of a conventional data sample diagnosis extraction method such as large data size and tedious process are overcome.

Description

technical field [0001] The invention relates to the field of fault diagnosis of power electronic devices, in particular to a fault diagnosis method for a photovoltaic diode clamped three-level inverter. Background technique [0002] With the rapid development of the photovoltaic industry, the application of photovoltaic microgrids is becoming more and more extensive. The direct current output by the photovoltaic array must be converted into alternating current to meet our daily needs. Therefore, in the photovoltaic microgrid, the photovoltaic inverter has become an indispensable part. Among inverters with different structures, multi-level inverters have received widespread attention due to their advantages such as series voltage equalization of power devices, small switching losses, low output voltage harmonic content, and high work efficiency. Because a large number of switching devices are used, the reliability of the circuit is relatively low. The failure of any device ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 陶洪峰周超超刘艳童亚军
Owner JIANGNAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products