In-situ photoelectric multifunctional coupling atomic force microscope testing system

Abstract

The invention discloses an in-situ photoelectric multifunctional coupling atomic force microscope testing system. The in-situ photoelectric multifunctional coupling atomic force microscope testing system comprises a light source and volt-ampere testing system of a photoelectric device, a multifunctional probe atomic force microscope system and an atmosphere protection system, wherein the light source and volt-ampere testing system of the photoelectric device comprises a fixture, a light source and a digital source meter; the multifunctional probe atomic force microscope system comprises a multifunctional probe, a laser emitter, a laser spot position detector, a laser detector, a data outgoing line and a computer display; the atmosphere protection system comprises a box, a gas inlet and outlet device, a spiral air current forming device, a temperature and humidity control device, a gas storage device, an occlusion design sliding door and an observing window. The testing system has the advantages that a photoelectric testing part and a multifunctional probe atomic force microscope are organically combined together in an integrated system, so that macroscopic photoelectric performance and microscopic information such as microscopic change information of electronics, ionization, polarization and the like of working samples can be tested synchronously in situ in real time.

Description

technical field [0001] The invention relates to a device for in-situ testing the macroscopic performance and microstructure of a photoelectric conversion device, in particular to an in-situ photoelectric multifunctional coupling atomic force microscope testing system. Background technique [0002] Atomic Force Microscope (AFM), an analytical instrument that can be used to study the surface structure of solid materials, including insulators. In 1986, Binnig collaborated with C.F. Quite of Stanford University and Christophe Gerber of IBM Zurich Laboratory to develop the atomic force microscope, which is a scanning probe microscope that does not require conductive samples {Phys. Rev. Lett., 1986, 56, 930-933}. It studies the surface structure and properties of substances by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a miniature force-sensitive element. One end of a pair of microcantilever sensitive to weak force is ...

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is that the existing photoelectric testing system and the multi-functional probe atomic force microscope can only test separately, individually and offline, which cannot satisfy scientific researchers to perform in-situ, synchronous and real-time macroscopic performance testing and microstructural characterization of samples. combined requirements

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