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Device and method for rapidly testing potential induced degradation of solar cell

A potential-induced attenuation and solar cell technology, which is applied in photovoltaic power generation, electrical components, photovoltaic system monitoring, etc., can solve the problems of long test period and inflexible test methods, and achieve short test period, shortened test period and accelerated aging speed effect

Active Publication Date: 2017-05-10
TRINA SOLAR CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention aims at technical problems such as long test period and inflexible test methods in the solar cell potential-induced attenuation test method in the prior art, and provides a device and method for quickly testing the solar cell potential-induced attenuation, shortening the test cycle, Increase testing flexibility and availability of test results

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  • Device and method for rapidly testing potential induced degradation of solar cell

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Comparison scheme
Effect test

Embodiment 1

[0033] Such as figure 1 Shown, the device of rapid test solar cell potential-induced decay of the present invention comprises:

[0034] The environment box 9 has a regulating device for adjusting temperature and humidity in the environment box 9;

[0035] The metal test bench 7 is set in the environmental chamber 9 and the table temperature of the metal test bench can be adjusted; the adjustment method can be electric heating, or a semiconductor temperature control platform. In this embodiment, the metal test bench 7 is a test bench made of metal copper.

[0036] An external power supply 8 can generate a voltage of 200V to 1000V as required; and,

[0037] Several metal probes 1, the metal probes 1 are connected to the external power supply 8 through wires, and the metal probes have pointed ends 11; the metal probes 1 can be one or more, and during the test process, by moving A single or a few metal probes, or directly in the form of a metal probe array, forms a uniformly di...

Embodiment 2

[0041] A kind of method of rapidly testing solar cell potential-induced decay of the present embodiment, comprises the following steps:

[0042] S1: Place the solar cell 10 to be tested on the metal test bench 7 in the environmental chamber 9. The solar cell 10 to be tested has: a front electrode 2, an antireflection film 3, an emitter 4, and a silicon substrate 5 and the back electrode 6;

[0043] S2: Adjust the temperature of the table top of the metal test bench 7 to 25°C, adjust the humidity in the environmental chamber to 30%, conduct a J-V test and an EL test on the solar cell to be tested, and record the test values;

[0044] S3: Connect the front electrode 2 of the solar cell and the metal test bench 7 with wires, adjust the table temperature of the metal test bench 7 to 90°C, adjust the humidity in the environmental chamber to 90%, and connect the metal probe 1 and the external power supply 8 with wires. It is connected in series with the metal test bench 7 in turn, ...

Embodiment 3

[0049] A kind of method for rapidly testing solar cell potential-induced decay of the present embodiment, comprises the following steps:

[0050] S1: Place the solar cell 10 to be tested on the metal test bench 7 in the environmental chamber 9. The solar cell 10 to be tested has: a front electrode 2, an antireflection film 3, an emitter 4, and a silicon substrate 5 and the back electrode 6;

[0051] S2: Adjust the temperature of the table top of the metal test bench 7 to 25°C, adjust the humidity in the environmental chamber to 40%, conduct a J-V test and an EL test on the solar cell to be tested, and record the test values;

[0052] S3: Connect the front electrode 2 of the solar cell and the metal test bench 7 with wires, adjust the table temperature of the metal test bench 7 to 80°C, adjust the humidity in the environmental chamber to 90%, and connect the metal probe 1 and the external power supply 8 with wires. It is connected in series with the metal test bench 7 in seque...

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Abstract

The invention discloses a device for rapidly testing potential induced degradation of a solar cell. The device comprises an environmental box, a metal test bench, an external power supply and a plurality of metal probes, wherein an adjustment device for adjusting temperature and humidity is arranged in the environmental box, the metal test bench is arranged in the environmental box, the temperature of a bench surface of the metal test bench can be adjusted, the external power supply generates a voltage of 200V to 1,000V, and the metal probes are connected with the external power supply by wires and are provided with tip end parts. The invention also discloses a method for rapidly testing the potential induced degradation of the solar cell. The device has the advantages of short test period, reliable test result, high sensitivity and the like; and the method is a battery terminal-based direct method for non-destructive observation on the potential induced degradation of the battery.

Description

technical field [0001] The invention relates to a testing device for potential-induced attenuation of a solar cell, in particular to a device and method for quickly testing the potential-induced attenuation of a solar cell, belonging to the technical field of solar cell testing. Background technique [0002] Potential Induced Degradation (PID, potential Induced Degradation) is one of the characteristics of photovoltaic cells. It refers to the phenomenon that the output will drop when high voltage flows through the solar cell unit in a high temperature and humid environment. [0003] Currently, potential-induced degradation is rapidly becoming one of the serious degradations in the field of photovoltaics. Modules are prone to serious power attenuation due to sodium ion migration or surface polarization in a high-temperature and high-humidity environment. The existing methods for testing the potential induced decay of solar cells mainly adopt the international IEC standard. T...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02S50/10
CPCH02S50/10Y02E10/50
Inventor 陈奕峰王子港杨阳徐冠超
Owner TRINA SOLAR CO LTD
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