Local test vector generating and optimizing method based on annular oscillator network
A technology of ring oscillators and test vectors, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., to improve the level of automated testing and practical application capabilities, reduce complexity, and improve detection efficiency.
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[0031] In order to reduce the generation efficiency of optimized test vectors and generate a simplified and efficient test vector set, the present invention proposes a local test vector generation system based on a ring oscillator network, which can generate optimized test vectors in local areas and improve circuit activity in local areas. Used for hardware Trojan testing and rough positioning.
[0032] For the analysis of an n-stage ring oscillator, if the delay of an inverter is t d (t,L,V DD ), it varies with time t, test vector L and power supply V DD The change also changes, then the overall delay of an n-stage ring oscillator is n*t d (t,L,V DD ), when the ring oscillator starts to oscillate, the oscillation period T is shown in Equation 1 below.
[0033] T=2*n*t d (t,L,V DD ) (1)
[0034] If within a fixed period of time K, the count value C of the counter is shown in formula 2 below.
[0035]
[0036] For a fixed test vector, the inverter delay t d (t,L,V ...
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