Adaptive trigger reinforcement circuit

Abstract

The invention provides an adaptive trigger reinforcement circuit, which comprises an inverter chain, latches, a control module, a calculation module and a delay filter module, wherein the inverter chain comprises multiple stages of cascaded inverters; the latch is connected with the output end of each stage of inverter for latching the output logic state of the inverter; the control module is used for controlling all latches at a certain moment to enable each latch to keep the output logic state of the corresponding inverter; the calculation module is used for calculating the number of inverters whose calculation logic changes, and with the transmission time delay of the inverter as a unit, the width of single event transient (SET) is calibrated; and the delay filter module is used for automatically setting accurate filter delay according to the width of the SET calibrated by the calculation module, and the SET of the trigger module can be filtered. The SET widths under bombardment of different energy particles can be measured accurately, the accurate delay setting of the filter circuit is ensured, the SET can be filtered accurately, and apart from acquiring predicted anti-single particle effects, the chip reinforcement DEF has a better area and the minimum speed compromise cost.

Description

technical field [0001] The invention relates to the field of single event effect research, in particular to an adaptive trigger reinforcement circuit. Background technique [0002] With the development of technologies in aerospace, military and other fields, more and more integrated circuits need to work in radiation environments. The effects of radiation on integrated circuits fall into two main categories: single event effects and total dose effects. [0003] Among them, the single event transient effect is the main factor affecting the chip performance. When the chip is placed in a radiation environment, the surrounding energy particles will be injected into the chip, and a certain number of electron and hole pairs will be generated on the trajectory of the energy particles due to the action of ionizing radiation; The upper circuit node sinks, changing the node level. If there is no feedback loop in the circuit on the chip, then after the time of single event action en...

AI Technical Summary

Problems solved by technology

2. Potentially dangerous effects: such as single event latch-up effect, if not controlled, may lead to single event burning of the chip

3. Single event hard error effects, such as displacement damage, will make the transistors in the chip completely inoperable

The circuit is equipped with a filter module to filter out the single-eve...

Images