Test system, classification system and test method

Abstract

The invention discloses a test system, a classification system and a test method. The test system is used to test a workpiece to be tested. The workpiece to be tested comprises at least one input end and / or at least one output end. The test system comprises an input test module which is used for generating a first millimeter wave signal according to a control signal, an output test module which is used for detecting a second millimeter wave signal according to the control signal, a connection module which is used for selecting one input end of the workpiece to be tested as the first input end according to the control signal, and selecting one output end of the workpiece to be tested as the first output end, and a control module which provides a control signal and acquires the test result of the workpiece to be tested according to sampling data. The first input end is connected with an input test module. The first output end is connected with an output test module. The first input end of the workpiece to be tested is corresponding to the first output end. A pre-configured port and other automated design are used to improve the test accuracy, the compatibility, the reliability, the flexibility and the test efficiency and reduce the cost.

Description

technical field [0001] The present invention relates to the field of electronic technology, more specifically, to a test system, a classification system and a test method. Background technique [0002] Millimeter waves usually refer to electromagnetic waves with a wavelength of 1 mm to 10 mm, and the corresponding frequency is 30 to 300 GHz. The characteristics of millimeter wave are: short wavelength, narrow beam, wide frequency band, strong ability to penetrate plasma, good all-weather capability and strong detection radiation characteristics, etc. Therefore, millimeter wave devices have been widely used. Millimeter-wave devices and millimeter-wave circuits play an important role in the development of a new generation of military radar, ultra-high-speed computers, electronic countermeasures, satellite communications, remote control, telemetry and new weapons. [0003] At present, there is a lack of automatic testing methods for millimeter wave devices in China. On the on...

AI Technical Summary

Problems solved by technology

On the one hand, ordinary millimeter-wave test equipment has disadvantages such as poor cross-band versatility, high price, and long procurement cycle, which leads to low feasibility of using ordinary millimeter-wave test equipment to build automated test solutions; on the other hand, using existing integrated circuits Automatic Test Equipment (ATE) can only measure a few parameters, and cannot realize the comprehensive measurement of various important parameters of millimeter wave devices. Therefore, there is a risk that backside millimeter wave devices fail but cannot be detected

[0004] The existing technology generally uses manual testing to measure millimeter-wave devices, but manual testing has low test efficiency and reliability, and cannot reduce test costs

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