Baffle-free nonuniformity correcting device and method for infrared images

Abstract

The invention discloses a baffle-free nonuniformity correcting device and method for infrared images. The method comprises the following steps: firstly, two calibration methods that a movement is allowed to be exposed or installed in a housing are carried out to obtain the responses of the movement corresponding to the different ambient temperatures in the two cases, and the detector substrate temperatures and the structure temperatures corresponding to the responses are recorded; high temperature two frame images are calibrated against a back body, a nonuniformity correction parameter K is calculated, and the K and the result of baffle-free calibration are saved in a FLASH; and in working, a background value in the FLASH module is read according to the substrate temperature, and the backgrounds corresponding to the current substrate and structure temperatures are calculated, and an input image is subjected to the nonuniformity correction output. The beneficial effects are that the baffle-free calibration is completed in a condition of simulating the working of an infrared imaging system; in working, real-time interpolation is performed to calculate the background parameter, and the nonuniformity correction of the image is completed in a baffle-free condition, so that the image quality is improved while the mechanical structure is reduced, and the system power consumption and noise are reduced.

Description

technical field [0001] The invention relates to a device for correcting non-uniformity of an infrared image without a baffle and a correction method thereof, and belongs to the technical field of infrared image processing. Background technique [0002] Since the 1990s, infrared technology is undergoing a third revolution, and uncooled infrared imaging technology represented by microbolometers and pyroelectric detectors has achieved important breakthroughs and achieved practical application. It not only solves the most prominent requirement of low temperature (~77K) cooling work in infrared imaging technology, but also realizes large-scale or ultra-large-scale integration with the readout circuit like photonic semiconductor infrared focal plane array technology, realizing high Density, miniaturization, portability and easy-to-operate thermal imaging cameras. [0003] However, affected by the material and process of infrared detectors, the non-uniformity of infrared focal pla...

AI Technical Summary

Problems solved by technology

However, a few seconds of blindness will occur when the baffle is under the cover. In a fast-moving workplace, it is not conducive to observing the surrounding conditions, and the introduction of the baffle into the mechanical structure will increase the power consumption and noise of the system.

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