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High-resolution echelle grating spectrometer two-dimensional deviation spectrum analysis and correction method

An echelle grating and high-resolution technology, which is applied in the field of spectroscopy, can solve problems such as not being able to meet the needs of actual use, and achieve the effects of easy implementation, calibration work, and simple operation

Active Publication Date: 2017-08-29
NCS TESTING TECH
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Problems solved by technology

[0005] In view of the above technical problems, the purpose of the present invention is to provide a method for analyzing and correcting the two-dimensional deviation spectrum of a high-resolution échelle spectrometer, so as to solve the problem that the two-dimensional spectrum of a high-resolution échelle spectrometer has deviations, which cannot meet the actual requirements. The problem of using requirements

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  • High-resolution echelle grating spectrometer two-dimensional deviation spectrum analysis and correction method

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[0049]Taking the analysis and correction of the two-dimensional deviation spectrum of an échelle spectrometer as an example, the method for analyzing and correcting the two-dimensional deviation spectrum of the high-resolution échelle spectrometer of the present invention will be further described in detail. However, this embodiment should not be construed as limiting the protection scope of the present invention.

[0050] The system parameters of the echelle spectrometer are shown in Table 1.

[0051] Step 1, using a mercury lamp as a linear light source to obtain a two-dimensional spectrogram of the discrete spectrum of the echelle spectrometer mercury lamp, as shown in image 3 Shown; Adopt the deuterium lamp as the continuous light source, obtain the two-dimensional spectrogram of the continuous spectrum of the deuterium lamp of the echelle spectrometer, such as Figure 4 shown.

[0052] To interpret the two-dimensional spectrum of the discrete spectrum, select three ref...

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Abstract

The present invention belongs to the spectrum technology field, and especially relates to a high-resolution echelle grating spectrometer two-dimensional deviation spectrum analysis and correction method. The method comprises the following steps: the step 1, obtaining the echelle grating spectrometer two-dimensional spectrum; the step 2, performing interpretation of the obtained two-dimensional spectrum; the step 3, performing inversion of deviation values of prism parameters and / or deviation values of echelle grating parameters; and the step 4, performing correction of the echelle grating spectrometer two-dimensional deviation spectrum. The high-resolution echelle grating spectrometer two-dimensional deviation spectrum analysis and correction method can realize qualitative analysis and quantitative calculation of the two-dimensional deviation spectrum, can realize correction work of the two-dimensional deviation spectrogram, and can fully develop the advantages of high spectral resolution, high sensitivity and low detection limit of the echelle grating spectrometer after analysis and correction of the two-dimensional deviation spectrum; and moreover, the correction method only needs to perform small changing of installation and adjustment tools and is simple to operate and easy to realize, etc.

Description

technical field [0001] The invention belongs to the field of spectrum technology, and in particular relates to a method for analyzing and correcting a two-dimensional deviation spectrum of a high-resolution échelle grating spectrometer. Background technique [0002] In recent years, atomic emission spectrometers are constantly developing in the direction of full-spectrum direct reading, intelligence, miniaturization, and low analysis cost. As the core part of the atomic emission spectrometer, the spectroscopic system directly determines the performance level of the overall instrument. High-resolution échelle grating spectrometer has the advantages of wide band range, high resolution, high sensitivity, full-spectrum transient measurement, etc., and has become the focus of atomic emission spectroscopic analysis technology research. [0003] The echelle spectrometer is a kind of full-spectrum spectrometer with low dispersion prism and high dispersion echelle grating cross disp...

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Application Information

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IPC IPC(8): G01J3/443
CPCG01J3/443
Inventor 李宏伟曹海霞何淼赵英飞
Owner NCS TESTING TECH
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