Method for mechanically prethinning cross section transmission electron microscope test sample

A technology of transmission electron microscopy and cross-section, which is applied in the direction of material analysis by measuring secondary emissions, and can solve problems such as sample loss, non-parallel pre-thinning success rate, sample grinding and perforation, etc.

Inactive Publication Date: 2017-09-01
DALIAN JIAOTONG UNIVERSITY
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0003] The proposal of the present invention is aimed at the pre-thinned dimensions encountered in the process of mechanical pre-thinning of the cross-sectional transmission sample to about 0.030mm, or the pre-thinned size is too thick, the sample is grou

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  • Method for mechanically prethinning cross section transmission electron microscope test sample
  • Method for mechanically prethinning cross section transmission electron microscope test sample
  • Method for mechanically prethinning cross section transmission electron microscope test sample

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Embodiment Construction

[0024] Such as figure 1 , figure 2 , image 3 , Figure 4 A mechanical pre-thinning method for a cross-sectional transmission electron microscope sample is shown, including a semicircular sample strip 1 with a diameter of 3 mm, a sample 2, a gasket 3, a stainless steel column 4, and a digital display dial indicator fixed on the base 5 , characterized by the following steps:

[0025] Step 1: Cut out a semicircular sample strip 1 with a diameter of 3mm from the sample by wire cutting, and heat and cure the two semicircular sample strips 1 with Gatan G2 resin. The curing temperature is 80-120°C and the curing time is 1 hour;

[0026] Step 2: Cut the sample strip with a diameter of 3mm after the resin is cured, and cut a sample 2 with a thickness of 0.8mm with a low-speed saw;

[0027] Step 3: Make a washer 3 with an outer diameter of 20mm, an inner diameter of 6mm, a thickness of 0.8mm, and a material of No. 45 steel;

[0028] Step 4: making a stainless steel cylinder 4 wit...

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Abstract

The invention relates to a method for mechanically prethinning a cross section transmission electron microscope test sample. The method comprises the following steps: adhering a test sample together with a nut washer to the center of an end surface of a stainless steel column, and grinding with handheld abrasive paper; in the grinding process, measuring the thickness of the nut washer at multiple points by using a digital dial gauge fixed on a base so as to ensure the thickness of the test sample and parallel state of an upper surface to a lower surface; when the test sample is grinded to a half of original thickness, turning over the surface, and grinding the test sample to 0.03mm by using a same method. By adopting the method provided by the invention, situations that prethinning sizes are not sufficient or abrasion omission is caused in the sampling process are avoided; meanwhile the test sample is not grinded into a wedge shape, so that a prethinned test sample that small damage is caused, the thickness is qualified and the upper surface is parallel to the lower surface is obtained. The method provided by the invention is not only applicable to prethinning of a cross section transmission for studying interfaces, but also applicable to blocky materials, and has the advantages of being low in cost, high in success rate and the like.

Description

technical field [0001] The invention relates to a method for mechanically pre-thinning a transmission electron microscope sample to a required size, especially suitable for mechanical pre-thinning of a cross-section transmission electron microscope sample, and also suitable for mechanical pre-thinning of a transmission electron microscope sample of a bulk material , belongs to the field of sample preparation for transmission electron microscopy. Background technique [0002] Transmission electron microscope (TEM) is an effective tool for observing and analyzing the morphology, organization and structure of materials. Sample preparation plays a decisive role in electron microscopy research. Focused ion beam (FIB) can prepare better TEM samples, but its equipment is expensive and the cost of sample preparation is high, so it cannot be popularized in all scientific research institutions. Therefore, traditional methods such as electrolytic double spraying, ion thinning, and ul...

Claims

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Application Information

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IPC IPC(8): G01N23/22
Inventor 王帅帅陈春焕赵秀娟
Owner DALIAN JIAOTONG UNIVERSITY
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