Single event transient disturbance reinforced latch circuit

Abstract

The invention relates to a single event transient disturbance reinforced latch circuit and belongs to the field of circuit design. The single event transient disturbance reinforced latch circuit comprises a first lowpass filter unit and a latch. First way data input of a data input end is connected with a first input end of the latch. Second data input of the data input end is connected with a second input end of the latch through the first lowpass filter unit. The first lowpass filter unit is a circuit unit which is composed of a passive device and is used for removing a high-frequency signal. The first lowpass filter unit for removing the high-frequency signal is composed of the passive device, the filter capacity only needs to be greater than the maximum pulse width produced by single event transient disturbance, the working frequency of the latch circuit is not influenced, and a circuit structure is simple. The passive device itself does not produce the single event transient disturbance and an area and the power consumption of a storage unit are not increased, so the single event effect resistance of logic circuits such as the latch and a trigger can be effectively improved.

Description

technical field [0001] The invention belongs to the field of circuit design and relates to a single-event transient disturbance reinforced latch circuit. Background technique [0002] When electronic devices work in space, they will be bombarded by high-energy protons, high-energy neutrons and cosmic heavy ions. Both the impact itself and the secondary particles generated by the impact will ionize electron-hole pairs on the bulk silicon, and when the amount of ionized accumulated charge reaches a certain magnitude, it will disturb the state of the circuit. Such as: bit flips in memory cells, transient pulses in combinational logic, etc. These effects are often called single event effects. [0003] Under large-scale process conditions, the impact of single event effects on circuits is mainly manifested as single event upset (English: single event upset, referred to as: SEU), which mainly affects circuits with memory structures. For the small-scale process, the circuit will ...

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Problems solved by technology

[0005] In order to solve the problem of poor stability and reliability in the application of electronic devices in space due to the influence of single event flipping and single event transient disturbance effects in small-scale circuit technology in the related art, this application provides a single Particle transient disturbance reinforcement latch circuit, which uses passive devices to form a low-pass filter on the basis of not increasing power consumption and reducing the operating frequency of the circuit, and performs disturbances generated by single-event transient effects at the data input end. Filtering, thereby improving the anti-single event effect capability of sequential logic circuits such as latches and flip-flops

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